Guy Brizar

According to our database, Guy Brizar authored at least 2 papers between 2012 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage.

John M. McGlone, Guy Brizar, Daniel Vanderstraeten, Dorai Iyer, Sallie Hose, Jeff P. Gambino

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2012

Comparison of experimental methods for the extraction of the elastic modulus of molding compounds used in IC packaging.

Andrej Ivankovic, Kris Vanstreels, Daniel Vanderstraeten, Guy Brizar, Renaud Gillon, Eddy Blansaer, Bart Vandevelde

Microelectron. Reliab., 2012