Alexandre Sarafianos

According to our database, Alexandre Sarafianos authored at least 16 papers between 2012 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2022

Checking Robustness Against EM Side-Channel Attacks Prior to Manufacturing.

Davide Poggi, Thomas Ordas, Alexandre Sarafianos, Philippe Maurine

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021

Protecting Secure ICs Against Side-Channel Attacks by Identifying and Quantifying Potential EM and Leakage Hotspots at Simulation Stage.

Davide Poggi, Philippe Maurine, Thomas Ordas, Alexandre Sarafianos

Proceedings of the Constructive Side-Channel Analysis and Secure Design, 2021

2020

Finding EM leakages at design stage: a simulation methodology.

Davide Poggi, Philippe Maurine, Thomas Ordas, Alexandre Sarafianos, Jérémy Raoult

IACR Cryptol. ePrint Arch., 2020

2015

Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation.

Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos

Microelectron. Reliab., 2015

Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.

Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses.

Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.

Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.

Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

Influence of triple-well technology on laser fault injection and laser sensor efficiency.

Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

2014

Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.

Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos

Microelectron. Reliab., 2014

Laser-induced fault effects in security-dedicated circuits.

Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

Laser attacks on integrated circuits: From CMOS to FD-SOI.

Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale

Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

2013

Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell.

Alexandre Sarafianos, Cyril Roscian, Jean-Max Dutertre, Mathieu Lisart, Assia Tria

Microelectron. Reliab., 2013

Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells.

Cyril Roscian, Alexandre Sarafianos, Jean-Max Dutertre, Assia Tria

Proceedings of the 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2013

Robustness improvement of an SRAM cell against laser-induced fault injection.

Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.

Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012