Alexandre Boyer
Orcid: 0000-0003-4955-5915
According to our database1,
Alexandre Boyer
authored at least 34 papers
between 2003 and 2022.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2022
Contributions to Computing needs in High Energy Physics Offline Activities: Towards an efficient exploitation of heterogeneous, distributed and shared Computing Resources. (Contributions aux besoins informatiques dans les activités hors-ligne du domaine de la Physique des Hautes-Énergies: Vers une exploitation efficace de ressources de calcul partagées, hétérogènes et distribuées).
PhD thesis, 2022
2021
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes.
IEEE Trans. Instrum. Meas., 2021
Vessel Identification using Convolutional Neural Network-based Hardware Accelerators.
Proceedings of the IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, 2021
2019
Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019
2018
New defect detection approach using near electromagnetic field probing of high density PCBAs.
Microelectron. Reliab., 2018
Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis.
J. Electron. Test., 2018
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs.
Proceedings of the 27th IEEE North Atlantic Test Workshop, 2018
2015
Electronic counterfeit detection based on the measurement of electromagnetic fingerprint.
Microelectron. Reliab., 2015
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter.
Microelectron. Reliab., 2015
Microelectron. Reliab., 2015
Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015
EMC performance analysis of a processor/memory system using PCB and Package-On-Package.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015
Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015
2014
Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits.
J. Low Power Electron., 2014
Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI).
Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing.
Proceedings of the 15th Latin American Test Workshop, 2014
2013
LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing.
Microelectron. Reliab., 2013
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project.
Microelectron. Reliab., 2013
Proceedings of the 14th Latin American Test Workshop, 2013
Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI.
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission.
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013
2012
IEEE Trans. Instrum. Meas., 2012
J. Electron. Test., 2012
2011
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences.
Microelectron. Reliab., 2011
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.
Microelectron. Reliab., 2011
Int. J. Fuzzy Syst. Appl., 2011
IEICE Trans. Electron., 2011
2010
Microelectron. Reliab., 2010
2008
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits.
Microelectron. J., 2008
2003
Design of a micromachined thermal accelerometer: thermal simulation and experimental results.
Microelectron. J., 2003