Jingyu Pan

According to our database, Jingyu Pan authored at least 26 papers between 2019 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2026

Frequency-Enhanced Diffusion Models: Curriculum-Guided Semantic Alignment for Zero-Shot Skeleton Action Recognition.

Yuxi Zhou, Zhengbo Zhang, Jingyu Pan, Zhiyu Lin, Zhigang Tu

CoRR, April, 2026

AstroTune: AST-Assisted LLM Retrieval for Cross-Stage Design Flow Parameter Tuner.

Runzhi Wang, Jingyu Pan, Yiran Chen, Jiang Hu

Proceedings of the 2026 International Symposium on Physical Design, 2026

2025

AutoEDA: Enabling EDA Flow Automation through Microservice-Based LLM Agents.

Yiyi Lu, Hoiian Au, Junyao Zhang, Jingyu Pan, Yiting Wang, Ang Li, Jianyi Zhang, Yiran Chen

CoRR, August, 2025

A Survey of Research in Large Language Models for Electronic Design Automation.

Jingyu Pan, Guanglei Zhou, Chen-Chia Chang, Isaac Jacobson, Jiang Hu, Yiran Chen

ACM Trans. Design Autom. Electr. Syst., May, 2025

Spatial-temporal video grounding with cross-modal understanding and enhancement.

Shu Luo, Jingyu Pan, Da Cao, Jiawei Wang, Yuquan Le, Meng Liu

Expert Syst. Appl., 2025

Diffusion-Model-Enhanced Layout Pattern Generation for Sub-3nm DFM.

Guanglei Zhou, Chen-Chia Chang, Junyao Zhang, Jingyu Pan, Yiran Chen

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2025

CROP: Circuit Retrieval and Optimization with Parameter Guidance using LLMs.

Jingyu Pan, Isaac Jacobson, Zheng Zhao, Tung-Chieh Chen, Guanglei Zhou, Chen-Chia Chang, Vineet Rashingkar, Yiran Chen

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2025

PatternPaint: Practical Layout Pattern Generation Using Diffusion-Based Inpainting.

Guanglei Zhou, Bhargav Korrapati, Gaurav Rajavendra Reddy, Chen-Chia Chang, Jingyu Pan, Jiang Hu, Yiran Chen, Dipto G. Thakurta

Proceedings of the 62nd ACM/IEEE Design Automation Conference, 2025

PRICING: Privacy-Preserving Circuit Data Sharing Framework for Lithographic Hotspot Detection.

Chen-Chia Chang, Wan-Hsuan Lin, Jingyu Pan, Guanglei Zhou, Zhiyao Xie, Jiang Hu, Yiran Chen

Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2024

Lithography Hotspot Detection Based on Heterogeneous Federated Learning With Local Adaptation and Feature Selection.

Jingyu Pan, Xuezhong Lin, Jinming Xu, Yiran Chen, Cheng Zhuo

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2024

Toward Fully Automated Machine Learning for Routability Estimator Development.

Chen-Chia Chang, Jingyu Pan, Zhiyao Xie, Tunhou Zhang, Jiang Hu, Yiran Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., March, 2024

EDALearn: A Comprehensive RTL-to-Signoff EDA Benchmark for Democratized and Reproducible ML for EDA Research.

Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Yiran Chen, Hai Helen Li

Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, 2024

2023

The Dark Side: Security and Reliability Concerns in Machine Learning for EDA.

Zhiyao Xie, Jingyu Pan, Chen-Chia Chang, Jiang Hu, Yiran Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2023

EDALearn: A Comprehensive RTL-to-Signoff EDA Benchmark for Democratized and Reproducible ML for EDA Research.

Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Yiran Chen

CoRR, 2023

PANDA: Architecture-Level Power Evaluation by Unifying Analytical and Machine Learning Solutions.

Qijun Zhang, Shiyu Li, Guanglei Zhou, Jingyu Pan, Chen-Chia Chang, Yiran Chen, Zhiyao Xie

Proceedings of the IEEE/ACM International Conference on Computer Aided Design, 2023

Fully Automated Machine Learning Model Development for Analog Placement Quality Prediction.

Chen-Chia Chang, Jingyu Pan, Zhiyao Xie, Yaguang Li, Yishuang Lin, Jiang Hu, Yiran Chen

Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023

Rethink before Releasing Your Model: ML Model Extraction Attack in EDA.

Chen-Chia Chang, Jingyu Pan, Zhiyao Xie, Jiang Hu, Yiran Chen

Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023

2022

Preplacement Net Length and Timing Estimation by Customized Graph Neural Network.

Zhiyao Xie, Rongjian Liang, Xiaoqing Xu, Jiang Hu, Chen-Chia Chang, Jingyu Pan, Yiran Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Steady-state entanglement in a mechanically coupled double cavity containing magnetic spheres.

Yabo Zhao, Ruiqing Zhao, Lanxin Chen, Jingyu Pan, Mei Zhang

Quantum Inf. Process., 2022

The Dark Side: Security Concerns in Machine Learning for EDA.

Zhiyao Xie, Jingyu Pan, Chen-Chia Chang, Yiran Chen

CoRR, 2022

DEEP: Developing Extremely Efficient Runtime On-Chip Power Meters.

Zhiyao Xie, Shiyu Li, Mingyuan Ma, Chen-Chia Chang, Jingyu Pan, Yiran Chen, Jiang Hu

Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, 2022

Robustify ML-Based Lithography Hotspot Detectors.

Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Jiang Hu, Yiran Chen

Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, 2022

Towards collaborative intelligence: routability estimation based on decentralized private data.

Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Ang Li, Minxue Tang, Tunhou Zhang, Jiang Hu, Yiran Chen

Proceedings of the DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10, 2022

Lithography Hotspot Detection via Heterogeneous Federated Learning with Local Adaptation.

Xuezhong Lin, Jingyu Pan, Jinming Xu, Yiran Chen, Cheng Zhuo

Proceedings of the 27th Asia and South Pacific Design Automation Conference, 2022

2021

Automatic Routability Predictor Development Using Neural Architecture Search.

Chen-Chia Chang, Jingyu Pan, Tunhou Zhang, Zhiyao Xie, Jiang Hu, Weiyi Qi, Chung-Wei Lin, Rongjian Liang, Joydeep Mitra, Elias Fallon, Yiran Chen

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021

2019

One Fault is All it Needs: Breaking Higher-Order Masking with Persistent Fault Analysis.

Jingyu Pan, Fan Zhang, Kui Ren, Shivam Bhasin

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019