Joel L. Plawsky

According to our database, Joel L. Plawsky authored at least 3 papers between 2005 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2018

Charge transport model to predict dielectric breakdown as a function of voltage, temperature, and thickness.

Sean P. Ogden, Yueming Xu, Kong Boon Yeap, Tian Shen, Toh-Ming Lu, Joel L. Plawsky

Microelectron. Reliab., 2018

2015

A moisture-related breakdown mechanism in low-k dielectrics using a multiple I-V ramp test.

Sean P. Ogden, Juan Borja, Huawei Zhou, Joel L. Plawsky, Toh-Ming Lu, William N. Gill

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2005

Modeling and predictive control of a rotating disk bioreactor.

Matthew Kuure-Kinsey, Dale Weber, Henry R. Bungay, Joel L. Plawsky, B. Wayne Bequette

Proceedings of the American Control Conference, 2005