John Schulze

According to our database, John Schulze authored at least 4 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Global Control Signal Defect Diagnosis in Volume Production Environment.

Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski

Proceedings of the IEEE International Test Conference, 2023

2017

Maximizing scan pin and bandwidth utilization with a scan routing fabric.

Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood

Proceedings of the IEEE International Test Conference, 2017

2016

Toward more efficient scan data bandwidth utilization on modern SOCs.

Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood

Proceedings of the 29th IEEE International System-on-Chip Conference, 2016

2014

Mitigating voltage droop during scan with variable shift frequency.

John Schulze, Ryan Tally

Proceedings of the 2014 International Test Conference, 2014