John T. Chen

According to our database, John T. Chen authored at least 3 papers between 2001 and 2002.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2002

Fault Tuples in Diagnosis of Deep-Submicron Circuits.

Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Enabling Embedded Memory Diagnosis via Test Response Compression.

John T. Chen, Wojciech Maly, Janusz Rajski, Omar Kebichi, Jitendra Khare

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring.

John T. Chen, Jitendra Khare, Ken Walker, Saghir A. Shaikh, Janusz Rajski, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001