Kumar N. Dwarakanath

According to our database, Kumar N. Dwarakanath authored at least 9 papers between 2000 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2006

Defect Modeling Using Fault Tuples.

Ronald D. Blanton, Kumar N. Dwarakanath, Rao Desineni

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

A reconfigurable design-for-debug infrastructure for SoCs.

Miron Abramovici, Paul Bradley, Kumar N. Dwarakanath, Peter Levin, Gérard Memmi, Dave Miller

Proceedings of the 43rd Design Automation Conference, 2006

2004

Generalized Sensitization using Fault Tuples.

Sounil Biswas, Kumar N. Dwarakanath, R. D. (Shawn) Blanton

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST.

Chunsheng Liu, Kumar N. Dwarakanath, Krishnendu Chakrabarty, Ronald D. Blanton

Proceedings of the 2004 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2004), 2004

2003

Analyzing the Effectiveness of Multiple-Detect Test Sets.

R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Anirudh B. Shah

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Exploiting Dominance and Equivalence using Fault Tuples.

Kumar N. Dwarakanath, R. D. (Shawn) Blanton

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Fault Tuples in Diagnosis of Deep-Submicron Circuits.

Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000

Universal test generation using fault tuples.

Rao Desineni, Kumar N. Dwarakanath, Ronald D. Blanton

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Universal fault simulation using fault tuples.

Kumar N. Dwarakanath, Ronald D. Blanton

Proceedings of the 37th Conference on Design Automation, 2000