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Jongkyun Kim

According to our database1, Jongkyun Kim authored at least 5 papers between 2013 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2021
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM.
[BibTeX]
[DOI]
Donghee Son
,
Gang-Jun Kim
,
Jongkyun Kim
,
Nam-Hyun Lee
,
Kijin Kim
,
Sangwoo Pae
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2019
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM.
[BibTeX]
[DOI]
Nam-Hyun Lee
,
Jongkyun Kim
,
Donghee Son
,
Kangjun Kim
,
Jung Eun Seok
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Effect of DC/AC stress on the reliability of cell capacitor in DRAM.
[BibTeX]
[DOI]
Gang-Jun Kim
,
Nam-Hyun Lee
,
Jongkyun Kim
,
Jung Eun Seok
,
Yunsung Lee
Microelectron. Reliab., 2018

Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM.
[BibTeX]
[DOI]
Jongkyun Kim
,
Namhyun Lee
,
Gang-Jun Kim
,
Young-Yun Lee
,
Jung-Eun Seok
,
Yunsung Lee
Microelectron. Reliab., 2018

2013
A small-sized class-J power amplifier from combined multi-harmonic voltage reflection functions.
[BibTeX]
[DOI]
Youngcheol Park
,
Jongkyun Kim
IEICE Electron. Express, 2013


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