Donghee Son

According to our database, Donghee Son authored at least 14 papers between 2013 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

Strain-Dependent Photoacoustic Characteristics of Free-Standing Carbon-Nanocomposite Transmitters.

Muhammad Faraz, Muhammad Awais Abbasi, Donghee Son, Changhwan Shin, Kyu-Tae Lee, Sang Min Won, Hyoung Won Baac

Sensors, 2022

Quantitative Evaluation of Line-Edge Roughness in Various FinFET Structures: Bayesian Neural Network With Automatic Model Selection.

Sangho Yu, Sang Min Won, Hyoung Won Baac, Donghee Son, Changhwan Shin

IEEE Access, 2022

2021

Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM.

Donghee Son, Gang-Jun Kim, Jongkyun Kim, Nam-Hyun Lee, Kijin Kim, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Noise Conditional Flow Model for Learning the Super-Resolution Space.

Younggeun Kim, Donghee Son

Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops, 2021

2019

Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM.

Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Fractal Residual Network and Solutions for Real Super-Resolution.

Junhyung Kwak, Donghee Son

Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops, 2019

NTIRE 2019 Challenge on Real Image Super-Resolution: Methods and Results.

Jianrui Cai, Shuhang Gu, Radu Timofte, Lei Zhang, Xiao Liu, Yukang Ding, Dongliang He, Chao Li, Yi Fu, Shilei Wen, Ruicheng Feng, Jinjin Gu, Yu Qiao, Chao Dong, Dongwon Park, Se Young Chun, Sanghoon Yoon, Junhyung Kwak, Donghee Son, Syed Waqas Zamir, Aditya Arora, Salman H. Khan, Fahad Shahbaz Khan, Ling Shao, Zhengping Wei, Lei Liu, Hong Cai, Darui Li, Fujie Gao, Zheng Hui, Xiumei Wang, Xinbo Gao, Guoan Cheng, Ai Matsune, Qiuyu Li, Leilei Zhu, Huaijuan Zang, Shu Zhan, Yajun Qiu, Ruxin Wang, Jiawei Li, Yongcheng Jing, Mingli Song, Pengju Liu, Kai Zhang, Jingdong Liu, Jiye Liu, Hongzhi Zhang, Wangmeng Zuo, Wenyi Tang, Jing Liu, Youngjung Kim, Changyeop Shin, Minbeom Kim, Sungho Kim, Pablo Navarrete Michelini, Hanwen Liu, Dan Zhu, Xuan Xu, Xin Li, Furui Bai, Xiaopeng Sun, Lin Zha, Yuanfei Huang, Wen Lu, Yanpeng Cao, Du Chen, Zewei He, Anshun Sun, Siliang Tang, Hongfei Fan, Xiang Li, Guo Li, Wenjie Zhang, Yumei Zhang, Qingwen He, Jinghui Qin, Lishan Huang, Yukai Shi, Pengxu Wei, Wushao Wen, Liang Lin, Jun Yu, Guochen Xie, Mengyan Li, Rong Chen, Xiaotong Luo, Chen Hong, Yanyun Qu, Cuihua Li, Zhi-Song Liu, Li-Wen Wang, Chu-Tak Li, Can Zhao, Bowen Li, Chung-Chi Tsai, Shang-Chih Chuang, Joonhee Choi, Joonsoo Kim, Xiaoyun Jiang, Ze Pan, Qunbo Lv, Zheng Tan, Peidong He

Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops, 2019

2018

Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress.

Yeohyeok Yun, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

Microelectron. Reliab., 2018

Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.

Yeohyeok Yun, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

Microelectron. Reliab., 2018

Unified Cox model based multifactor dimensionality reduction method for gene-gene interaction analysis of the survival phenotype.

Seungyeoun Lee, Donghee Son, Yongkang Kim, Wenbao Yu, Taesung Park

BioData Min., 2018

Towards the Development of Bidirectional Peripheral Nerve Interface for Long-term Implantation.

HyungDal Park, Wonsuk Choi, Woohyun Jung, Ockchul Kim, Jun-Uk Chu, Donghee Son, Jong Woong Park, Jinseok Kim

Proceedings of the IEEE International Conference on Cyborg and Bionic Systems, 2018

2016

Channel width dependence of AC stress on bulk nMOSFETs.

Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang

Microelectron. Reliab., 2016

Degradation of pMOSFETs due to hot electron induced punchthrough.

Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang

Microelectron. Reliab., 2016

2013

Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs.

Seonhaeng Lee, Cheolgyu Kim, Hyeokjin Kim, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

Microelectron. Reliab., 2013