Julien Vial

According to our database, Julien Vial authored at least 4 papers between 2008 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Is triple modular redundancy suitable for yield improvement?

Julien Vial, Arnaud Virazel, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch

IET Comput. Digit. Tech., 2009

2008

SoC Yield Improvement: Redundant Architectures to the Rescue?

Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 2008 IEEE International Test Conference, 2008

Yield Improvement, Fault-Tolerance to the Rescue?.

Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

Using TMR Architectures for Yield Improvement.

Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008