Kamran Souri

According to our database, Kamran Souri authored at least 17 papers between 2010 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

3.7 A 620µW BJT-Based Temperature-to-Digital Converter with 0.65mK Resolution and FoM of 190fJ·K².

Saleh Heidary Shalmany, Kamran Souri, Uaur Sonmez, Kianoush Souri, Michele D'Urbino, Said Hussaini, Darryl Tauro, Sassan Tabatabaei

Proceedings of the 2020 IEEE International Solid- State Circuits Conference, 2020

2017

A MEMS-Assisted Temperature Sensor With 20-µK Resolution, Conversion Rate of 200 S/s, and FOM of 0.04 pJK2.

Meisam Heidarpour Roshan, Samira Zaliasl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Amanpreet Singh, Sudhakar Pamarti, Nicholas Miller, Joseph C. Doll, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon

IEEE J. Solid State Circuits, 2017

2016

11.1 Dual-MEMS-resonator temperature-to-digital converter with 40 K resolution and FOM of 0.12pJK2.

Meisam Heidarpour Roshan, Samira Zali Asl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Sudhakar Pamarti, Joseph C. Doll, Nicholas Miller, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon

Proceedings of the 2016 IEEE International Solid-State Circuits Conference, 2016

2014

12.7 A 0.85V 600nW all-CMOS temperature sensor with an inaccuracy of ±0.4°C (3σ) from -40 to 125°C.

Kamran Souri, Youngcheol Chae, Frank Thus, Kofi A. A. Makinwa

Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

2013

A CMOS Temperature Sensor With a Voltage-Calibrated Inaccuracy of ±0.15°C (3σ) From -55°C to 125°C.

Kamran Souri, Youngcheol Chae, Kofi A. A. Makinwa

IEEE J. Solid State Circuits, 2013

A 6.3 µW 20 bit Incremental Zoom-ADC with 6 ppm INL and 1 µV Offset.

Youngcheol Chae, Kamran Souri, Kofi A. A. Makinwa

IEEE J. Solid State Circuits, 2013

A 6.3µW 20b incremental zoom-ADC with 6ppm INL and 1µV offset.

Youngcheol Chae, Kamran Souri, Kofi A. A. Makinwa

Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

A 40µW CMOS temperature sensor with an inaccuracy of ±0.4°C (3σ) from -55°C to 200°C.

Kamran Souri, Kianoush Souri, Kofi A. A. Makinwa

Proceedings of the ESSCIRC 2013, 2013

2012

A Scaled Thermal-Diffusivity-Based 16 MHz Frequency Reference in 0.16 µm CMOS.

Mahdi Kashmiri, Kamran Souri, Kofi A. A. Makinwa

IEEE J. Solid State Circuits, 2012

A CMOS temperature sensor with a voltage-calibrated inaccuracy of ±0.15°C (3σ) from -55 to 125°C.

Kamran Souri, Youngcheol Chae, Kofi A. A. Makinwa

Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012

2011

A 0.12 mm ² 7.4 μ W Micropower Temperature Sensor With an Inaccuracy of ± 0.2°C (3 Sigma ) From - 30°C to 125°C.

Kamran Souri, Kofi A. A. Makinwa

IEEE J. Solid State Circuits, 2011

A precision DTMOST-based temperature sensor.

Kamran Souri, Youngcheol Chae, Youri Ponomarev, Kofi A. A. Makinwa

Proceedings of the 37th European Solid-State Circuits Conference, 2011

A scaled thermal-diffusivity-based frequency reference in 0.16μm CMOS.

Mahdi Kashmiri, Kamran Souri, Kofi A. A. Makinwa

Proceedings of the 37th European Solid-State Circuits Conference, 2011

A 1.8V 11μW CMOS smart humidity sensor for RFID sensing applications.

Zhichao Tan, Roel Daamen, Aurelie Humbert, Kamran Souri, Youngcheol Chae, Youri V. Ponomarev, Michiel A. P. Pertijs

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2011

2010

A High PSRR Bandgap Voltage Reference with Virtually Diode-Connected MOS Transistors.

Kianoush Souri, Hossein Shamsi, Mehrshad Kazemi, Kamran Souri

IEICE Trans. Electron., 2010

A CMOS temperature sensor with an energy-efficient zoom ADC and an Inaccuracy of ±0.25°C (3s) from -40°C to 125°C.

Kamran Souri, Mahdi Kashmiri, Kofi A. A. Makinwa

Proceedings of the IEEE International Solid-State Circuits Conference, 2010

A 0.12mm2 7.4μW micropower temperature sensor with an inaccuracy of ±0.2°C (3σ) from -30°C to 125°C.

Kamran Souri, Kofi A. A. Makinwa

Proceedings of the 36th European Solid-State Circuits Conference, 2010