Ken-ichi Okada
This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.
Known people with the same name:
Bibliography
2025
A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement.
CoRR, April, 2025
2024
NeuroImage, January, 2024
2007
Low-Loss Distributed Constant Passive Devices Using Wafer-Level Chip Scale Package Technology.
IEICE Trans. Electron., 2007
2004
IEICE Trans. Inf. Syst., 2004
1999
Proceedings of the 1999 International Conference on Parallel Processing Workshops, 1999
1991
ACM SIGCHI Bull., 1991