Keneth R. Wilsher

According to our database, Keneth R. Wilsher authored at least 6 papers between 1999 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

Backside E-Beam Probing on Nano scale devices.

Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krüger

Proceedings of the 2007 IEEE International Test Conference, 2007

2003

An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits.

P. LeCoupanec, William K. Lo, Keneth R. Wilsher

Microelectron. Reliab., 2003

Designed -in-diagnostics: A new optical method.

Keneth R. Wilsher

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2001

Practical, non-invasive optical probing for flip-chip devices.

G. Dajee, Norman Goldblatt, Ted R. Lundquist, Steven Kasapi, Keneth R. Wilsher

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Optical interferometric probing of advanced microprocessors.

Travis M. Eiles, Keneth R. Wilsher, William K. Lo, G. Xiao

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Practical optical waveform probing of flip-chip CMOS devices.

Keneth R. Wilsher, William K. Lo

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999