Steven Kasapi

According to our database, Steven Kasapi authored at least 7 papers between 2001 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

Foundry workflow for dynamic-EFA-based yield ramp.

Cathy Kardach, I. Kapilevich, Jeffrey A. Block, Ted R. Lundquist, Steven Kasapi, J. Liao, Yin S. Ng, Bruce Cory

Microelectron. Reliab., 2011

2010

Scan chain failure analysis using laser voltage imaging.

Joy Y. Liao, Steven Kasapi, Bruce Cory, Howard L. Marks, Yin S. Ng

Microelectron. Reliab., 2010

2009

Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing.

Joy Y. Liao, Tung Ton, Nathan Slattengren, Steven Kasapi, William K. Lo, Howard L. Marks, Yin S. Ng, Ted R. Lundquist

Microelectron. Reliab., 2009

2008

Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology.

Ulrike Kindereit, Christian Boit, Uwe Kerst, Steven Kasapi, Radu Ispasoiu, Roy Ng, William K. Lo

Microelectron. Reliab., 2008

2006

Reduction of the acquisition time for CMOS time-resolved photon emission by optimized IR detection.

Radu Ispasoiu, Tom Crawford, Brian Johnston, Chris Shaw, Steven Kasapi, Jason Goertz, Olivier Rinaudo, Peter Ouimet

Microelectron. Reliab., 2006

2004

Overcoming Fault Test Coverage with Time-Resolved Emission (TRE) Probing.

Steven Kasapi, Bruce Cory

Microelectron. Reliab., 2004

2001

Practical, non-invasive optical probing for flip-chip devices.

G. Dajee, Norman Goldblatt, Ted R. Lundquist, Steven Kasapi, Keneth R. Wilsher

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001