Rudolf Schlangen

According to our database, Rudolf Schlangen authored at least 9 papers between 2005 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Focused ion beam contact to non-volatile memory cells.

Clemens Helfmeier, Rudolf Schlangen, Christian Boit

Microelectron. Reliab., 2014

2010

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization.

Rudolf Schlangen, Hervé Deslandes, Ted R. Lundquist, C. Schmidt, Frank Altmann, K. Yu, A. Andreasyan, S. Li

Microelectron. Reliab., 2010

2009

Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing.

Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Ted R. Lundquist, Peter Egger, Christian Boit

Microelectron. Reliab., 2009

2008

Physical Techniques for Chip-Backside IC Debug in Nanotechnologies.

Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted R. Lundquist

IEEE Des. Test Comput., 2008

2007

Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy.

Rudolf Schlangen, Uwe Kerst, Christian Boit, Tahir Malik, Rajesh Jain, Ted R. Lundquist

Microelectron. Reliab., 2007

Backside E-Beam Probing on Nano scale devices.

Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krüger

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node.

Rudolf Schlangen, Peter Sadewater, Uwe Kerst, Christian Boit

Microelectron. Reliab., 2006

2005

Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations.

Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit

Microelectron. Reliab., 2005

Impact of back side circuit edit on active device performance in bulk silicon ICs.

Uwe Kerst, Rudolf Schlangen, A. Kabakow, Erwan Le Roy, Ted R. Lundquist, Siegfried Pauthner

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005