Kuo-Hsing Kao

According to our database, Kuo-Hsing Kao authored at least 3 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Numerical Simulations of Gate-Granularity- Induced Subthreshold Characteristics Deterioration of MOSFETs Magnified at Cryogenic Temperatures.

Kuo-Hsing Kao, Zong-Hong Wang, Yu-Chia Pai, Chen-Chi Cheng, Darsen D. Lu, Wen-Jay Lee, Nan-Yow Chen

IEEE Access, 2024

Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications.

Kateryna Serbulova, Zi-En Qiu, Shih-Hung Chen, Alexander Grill, Kuo-Hsing Kao, Jo De Boeck, Guido Groeseneken

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

MOSFET Characterization with Reduced Supply Voltage at Low Temperatures for Power Efficiency Maximization.

W.-C. Lin, H.-P. Huang, Kuo-Hsing Kao, Meng-Hsueh Chiang, Darsen D. Lu, Wei-Chou Hsu, Yeong-Her Wang, William Cheng-Yu Ma, Hann-Huei Tsai, Y.-J. Lee, H.-L. Chiang, J.-F. Wang, Iuliana P. Radu

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023