Meng-Hsueh Chiang

Orcid: 0000-0003-4789-6302

According to our database1, Meng-Hsueh Chiang authored at least 14 papers between 2010 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
How Fault-Tolerant Quantum Computing Benefits from Cryo-CMOS Technology.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

MOSFET Characterization with Reduced Supply Voltage at Low Temperatures for Power Efficiency Maximization.
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

Performance Comparison of SRAM Designs Implemented with Silicon-On-Insulator Nanosheet Transistors and Bulk FinFETs.
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2021
Back-Bias Modulated UTBB SOI for System-on-Chip I/O Cells.
Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021

2020
Compact Device Models for FinFET and Beyond.
CoRR, 2020

2019
Speed Optimization of Vertically Stacked Gate-All-Around MOSFETs with Inner Spacers for Low Power and Ultra-Low Power Applications.
Proceedings of the 20th International Symposium on Quality Electronic Design, 2019

2018
Body-biasing assisted vmin optimization for 5nm-node multi-Vt FD-SOI 6T-SRAM.
Proceedings of the 19th International Symposium on Quality Electronic Design, 2018

An area efficient low-voltage 6-T SRAM cell using stacked silicon nanowires.
Proceedings of the 2018 International Conference on IC Design & Technology, 2018

2017
Threshold-voltage variability analysis and modeling for junctionless double-gate transistors.
Microelectron. Reliab., 2017

2016
Performance evaluation of stacked gate-all-around MOSFETs at 7 and 10 nm technology nodes.
Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

2015
6-T SRAM performance assessment with stacked silicon nanowire MOSFETs.
Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

2012
Assessment of structure variation in silicon nanowire FETs and impact on SRAM.
Microelectron. J., 2012

Design issues and insights of multi-fin bulk silicon FinFETs.
Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012

2010
Low power design of phase-change memory based on a comprehensive model.
IET Comput. Digit. Tech., 2010


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