Leqing Zhang

According to our database, Leqing Zhang authored at least 1 paper in 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs.

Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou

Microelectron. Reliab., 2017