Shichang Zou

According to our database, Shichang Zou authored at least 36 papers between 2011 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A novel high-precision single-event transient hardened voltage comparator design.

Yuqiao Xie, Zhongyang Liu, Tao Xu, Dawei Bi, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou

Int. J. Circuit Theory Appl., October, 2023

A highly stable and low-cost 12T radiation hardened SRAM cell design for aerospace application.

Zhongyang Liu, Yuqiao Xie, Tao Xu, Qing Liu, Dawei Bi, Zhiyuan Hu, Shichang Zou, Zhengxuan Zhang

Int. J. Circuit Theory Appl., August, 2023

2022

A High-Performance and Low-Cost Single-Event Multiple-Node-Upsets Resilient Latch Design.

Zhongyang Liu, Haineng Zhang, Jianwei Jiang, Yanjie Jia, Yuqiao Xie, Shichang Zou, Zhengxuan Zhang

IEEE Trans. Very Large Scale Integr. Syst., 2022

2020

A Wide-Range-Supply-Voltage Sense Amplifier Circuit for Embedded Flash Memory.

Wenyi Zhu, Jianwei Jiang, Haineng Zhang, Yiran Xu, Jun Xiao, Guangjun Yang, Shichang Zou

IEEE Trans. Circuits Syst. II Express Briefs, 2020

Electrical performance of 130 nm PD-SOI MOSFET with diamond layout.

Xiaonian Liu, Lihua Dai, Pingliang Li, Shichang Zou

Microelectron. J., 2020

Substrate effect on radiation-induced charge trapping in buried oxide for partially-depleted SOI NMOSFET.

Huilong Zhu, Dawei Bi, Xin Xie, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou

IEICE Electron. Express, 2020

2019

Quadruple Cross-Coupled Latch-Based 10T and 12T SRAM Bit-Cell Designs for Highly Reliable Terrestrial Applications.

Jianwei Jiang, Yiran Xu, Wenyi Zhu, Jun Xiao, Shichang Zou

IEEE Trans. Circuits Syst. I Regul. Pap., 2019

Demonstration of improvement of specific on-resistance versus breakdown voltage tradeoff for low-voltage power LDMOS.

Zhaozhao Xu, Donghua Liu, Jun Hu, Feng Jin, Xinjie Yang, Wenting Duan, Wei Yue, Ziquan Fang, Wensheng Qian, Weiran Kong, Shichang Zou

Microelectron. J., 2019

A charge pump system with new regulation and clocking scheme.

Wenyi Zhu, Jianwei Jiang, Dianpeng Lin, Jun Xiao, Guangjun Yang, Xiaoyun Li, Shichang Zou

IEICE Electron. Express, 2019

Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer.

Xin Xie, Huilong Zhu, Mengying Zhang, Dawei Bi, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou

IEICE Electron. Express, 2019

Soft-Error-Tolerant Ultralow-Leakage 12T SRAM Bitcell Design.

Jianwei Jiang, Dianpeng Lin, Jun Xiao, Shichang Zou

Proceedings of the International Conference on IC Design and Technology, 2019

2018

A 280-KBytes Twin-Bit-Cell Embedded NOR Flash Memory With a Novel Sensing Current Protection Enhanced Technique and High-Voltage Generating Systems.

Yiran Xu, Wenyi Zhu, Jun Xiao, Guangjun Yang, Jian Hu, Shengbo Zhang, Mingyong Huang, Weiran Kong, Shichang Zou

IEEE Trans. Circuits Syst. II Express Briefs, 2018

Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device.

Zhaozhao Xu, Donghua Liu, Wei Xiong, Jun Hu, Wenting Duan, Hualun Chen, Wensheng Qian, Weiran Kong, Shichang Zou

Microelectron. Reliab., 2018

A novel highly reliable and low-power radiation hardened SRAM bit-cell design.

Dianpeng Lin, Yiran Xu, Xiaonian Liu, Wenyi Zhu, Lihua Dai, Mengying Zhang, Xiaoyun Li, Xin Xie, Jianwei Jiang, Huilong Zhu, Zhengxuan Zhang, Shichang Zou

IEICE Electron. Express, 2018

A novel self-recoverable and triple nodes upset resilience DICE latch.

Dianpeng Lin, Yiran Xu, Xiaoyun Li, Xin Xie, Jianwei Jiang, Jiangchuan Ren, Huilong Zhu, Zhengxuan Zhang, Shichang Zou

IEICE Electron. Express, 2018

A novel SEU tolerant memory cell for space applications.

Dianpeng Lin, Yiran Xu, Xiaoyun Li, Xin Xie, Jianwei Jiang, Jiangchuan Ren, Huilong Zhu, Zhengxuan Zhang, Shichang Zou

IEICE Electron. Express, 2018

Total dose radiation induced changes of the floating body effects in the partially depleted SOI NMOS with ultrathin gate oxide.

Zhiyuan Hu, Lihua Dai, Zhengxuan Zhang, Xiaoyun Li, Shichang Zou

IEICE Electron. Express, 2018

2017

Investigation of read disturb in split-gate memory and its feasible solution.

Wenyi Zhu, Binghan Li, Tao Yu, Weiran Kong, Shichang Zou

Microelectron. Reliab., 2017

Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology.

Lei Song, Zhiyuan Hu, Mengying Zhang, Xiaonian Liu, Lihua Dai, Zhengxuan Zhang, Shichang Zou

Microelectron. Reliab., 2017

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs.

Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou

Microelectron. Reliab., 2017

A macro SPICE model for 2-bits/cell split-gate flash memory cell.

Xiaonian Liu, Yiran Xu, Xiangquan Fan, Mengxing Liao, Pingliang Li, Shichang Zou

Microelectron. J., 2017

A duplex current-reused CMOS LNA with complementary derivative superposition technique.

Ruofan Dai, Yunlong Zheng, Jun He, Weiran Kong, Shichang Zou

Int. J. Circuit Theory Appl., 2017

Area-efficient charge pump with local boost technique for embedded flash memory.

Yiran Xu, Wenyi Zhu, Jun Xiao, Guangjun Yang, Jian Hu, Xiaoyun Li, Weiran Kong, Shichang Zou

IEICE Electron. Express, 2017

2016

A 0.5-V novel complementary current-reused CMOS LNA for 2.4 GHz medical application.

Ruofan Dai, Yunlong Zheng, Jun He, Guojun Liu, Weiran Kong, Shichang Zou

Microelectron. J., 2016

Comparison of single-event transients of T-gate core and IO device in 130 nm partially depleted silicon-on-insulator technology.

Yunlong Zheng, Ruofan Dai, Zhuojun Chen, Shulong Sun, Zheng Wang, Zehua Sang, Min Lin, Shichang Zou

IEICE Electron. Express, 2016

2014

A Novel Sourceline Voltage Compensation Circuit and a Wordline Voltage-Generating System for Embedded nor Flash Memory.

Shengbo Zhang, Jun Xiao, Guangjun Yang, Jian Hu, Shichang Zou

IEEE Trans. Circuits Syst. II Express Briefs, 2014

A 1.35-V 16-Mb Twin-Bit-Cell Virtual-Ground-Architecture Embedded Flash Memory With a Sensing Current Protection Technique.

Shengbo Zhang, Jun Xiao, Guangjun Yang, Jian Hu, Mingyong Huang, Shichang Zou

IEEE Trans. Circuits Syst. I Regul. Pap., 2014

2013

Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs.

Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Zhiyuan Hu, Ming Chen, Shichang Zou

Microelectron. Reliab., 2013

Comprehensive study on the TID effects of 0.13 μm partially depleted SOI NMOSFETs.

Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Ming Chen, Shichang Zou

Microelectron. J., 2013

A compact and CMOS compatible MMI coupler with very low excess loss.

Zhen Sheng, Zhiqi Wang, Chao Qiu, Le Li, Albert Pang, Aimin Wu, Xi Wang, Shichang Zou, Fuwan Gan

Proceedings of the 2013 Optical Fiber Communication Conference and Exposition and the National Fiber Optic Engineers Conference (OFC/NFOEC), 2013

2012

Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology.

Bingxu Ning, Zhengxuan Zhang, Zhangli Liu, Zhiyuan Hu, Ming Chen, Dawei Bi, Shichang Zou

Microelectron. Reliab., 2012

2011

Hole tunneling from valence band and hot-carrier induced hysteresis effect in 0.13 μm partially depleted silicon-on-insulator n-MOSFETs.

Jianhua Zhou, Albert Pang, Steam Cao, Shichang Zou

Microelectron. Reliab., 2011

Comparison of TID response in core, input/output and high voltage transistors for flash memory.

Zhangli Liu, Zhiyuan Hu, Zhengxuan Zhang, Hua Shao, Ming Chen, Dawei Bi, Bingxu Ning, Shichang Zou

Microelectron. Reliab., 2011

Total ionizing dose effects in elementary devices for 180-nm flash technologies.

Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou

Microelectron. Reliab., 2011

The impact of total ionizing radiation on body effect.

Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Zhangli Liu, Ming Chen, Dawei Bi, Shichang Zou

Microelectron. J., 2011

Impact of within-wafer process variability on radiation response.

Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou

Microelectron. J., 2011