Lichao Zeng

Orcid: 0009-0003-6614-0049

According to our database¹, Lichao Zeng authored at least 3 papers between 2024 and 2026.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of five.

Timeline

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Bibliography

2026

A Hybrid Weakly Supervised Approach for enhanced High-Precision SEM Defect Segmentation in Nanoscale Semiconductor Manufacturing.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., March, 2026

2025

DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture.

[BibT_eX]

[DOI]

Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2024

Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation.

[BibT_eX]

[DOI]

Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024

Lichao Zeng

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