Yining Chen

According to our database, Yining Chen authored at least 15 papers between 2023 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2026

A Hybrid Weakly Supervised Approach for enhanced High-Precision SEM Defect Segmentation in Nanoscale Semiconductor Manufacturing.

Yibo Qiao, Weiping Xie, Shunyuan Lou, Qian Jin, Lichao Zeng, Yining Chen, Qi Sun, Cheng Zhuo

ACM Trans. Design Autom. Electr. Syst., March, 2026

A survey on semiconductor wafer yield prediction by artificial intelligence.

Dongyan Zhao, Yining Chen, Pang Guo, Fangke Chen, Ruyue Jing, Xin Xu, Yanning Chen, Fang Liu, Bo Wu

Microelectron. J., 2026

AMBCT: Adaptive multi-view Bayesian co-training for semi-supervised virtual metrology.

Jiangchen Wu, Fangke Chen, Pang Guo, Yuping Wang, Weiping Xie, Yining Chen, Dawei Gao

Expert Syst. Appl., 2026

REDM: Regression-Guided Diffusion Modeling for Universal Soft Sensor Enhancement in Semiconductor Process Control.

Weiping Xie, Yumeng Shi, Pang Guo, Yining Chen

Proceedings of the 31st Asia and South Pacific Design Automation Conference, 2026

2025

SCSNet: a novel transformer-CNN fusion architecture for enhanced segmentation and classification on high-resolution semiconductor micro-scale defects.

Yuening Luo, Zhouzhouzhou Mei, Yibo Qiao, Yining Chen

Appl. Intell., April, 2025

A novel joint segmentation approach for wafer surface defect classification based on blended network structure.

Zhouzhouzhou Mei, Yuening Luo, Yibo Qiao, Yining Chen

J. Intell. Manuf., March, 2025

SPPE-GAN: A novel model for Die-to-Database alignment and SEM distortion correction framework.

Yuping Wang, Yining Chen, Jiangchen Wu

Expert Syst. Appl., 2025

Yield Diagnosis and Tuning for Emerging Semiconductors During Research Stage.

Chunshan Wang, Zizhao Ma, Yuxuan Zhu, Chensheng Jin, Dongyu Chen, Chuxin Zhang, Yining Chen, Wenzhong Bao, Yufeng Xie

IEEE Access, 2025

KARMAD: KAN-Based Adversarial Robust Model for Anomaly Detection.

Fangke Chen, Xiaotian Qiu, Yihan Ye, Ruyue Jing, Yining Chen, Dawei Gao

Proceedings of the 41st IEEE International Conference on Data Engineering, 2025

DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture.

Lichao Zeng, Zhouzhouzhou Mei, Zhongyu Shi, Yining Chen

Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2024

Explainable prediction of deposited film thickness in IC fabrication with CatBoost and SHapley Additive exPlanations (SHAP) models.

Yumeng Shi, Yu Cai, Shunyuan Lou, Yining Chen

Appl. Intell., January, 2024

DeepSEM-Net: Enhancing SEM defect analysis in semiconductor manufacturing with a dual-branch CNN-Transformer architecture.

Yibo Qiao, Zhouzhouzhou Mei, Yuening Luo, Yining Chen

Comput. Ind. Eng., 2024

SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image.

Qian Jin, Yuqi Jiang, Xudong Lu, Yumeng Liu, Yining Chen, Dawei Gao, Qi Sun, Cheng Zhuo

Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, 2024

Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation.

Yibo Qiao, Weiping Xie, Shunyuan Lou, Qian Jin, Lichao Zeng, Yining Chen, Qi Sun, Cheng Zhuo

Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024

2023

A Method of Predicting the Deposited Film Thickness in IC Fabrication Based on Stacking Ensemble Learning.

Jiangchen Wu, Yumeng Shi, Yining Chen

Proceedings of the 2023 7th International Conference on Computer Science and Artificial Intelligence, 2023