Lorenzo Cardone

According to our database, Lorenzo Cardone authored at least 9 papers between 2022 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs.

Giusy Iaria, Paolo Bernardi, Claudia Bertani, Lorenzo Cardone, Giuseppe Garozzo, Vincenzo Tancorre

IEEE Trans. Computers, April, 2025

Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs.

Francesco Angione, Paolo Bernardi, Claudia Bertani, Lorenzo Bertetto, Lorenzo Cardone, Nicola Di Gruttola Giardino, Stefano Quer, Vincenzo Tancorre

Proceedings of the 26th IEEE Latin American Test Symposium, 2025

2024

Exploring trade-offs in multi-site wafer testing.

Paolo Bernardi, Lorenzo Cardone, Tommaso Foscale

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Efficiently Computing Maximum Clique of Sparse Graphs with Many-Core Graphical Processing Units.

Lorenzo Cardone, Salvatore Di Martino, Stefano Quer

Proceedings of the 19th International Conference on Software Technologies, 2024

2023

The Multi-Maximum and Quasi-Maximum Common Subgraph Problem.

Lorenzo Cardone, Stefano Quer

Comput., 2023

An Experimental Evaluation of Graph Coloring Heuristics on Multi- and Many-Core Architectures.

Alessandro Borione, Lorenzo Cardone, Andrea Calabrese, Stefano Quer

IEEE Access, 2023

About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics.

Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

A Web Scraping Algorithm to Improve the Computation of the Maximum Common Subgraph.

Andrea Calabrese, Lorenzo Cardone, Salvatore Licata, Marco Porro, Stefano Quer

Proceedings of the 18th International Conference on Software Technologies, 2023

2022

An innovative Strategy to Quickly Grade Functional Test Programs.

Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE International Test Conference, 2022