Francesco Angione
Orcid: 0000-0003-2978-1130
According to our database1,
Francesco Angione
authored at least 9 papers
between 2022 and 2023.
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Bibliography
2023
IEEE Trans. Computers, May, 2023
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips.
IEEE Access, 2023
A guided debugger-based fault injection methodology for assessing functional test programs.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems.
Proceedings of the 24th IEEE Latin American Test Symposium, 2023
2022
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip.
Proceedings of the 23rd IEEE Latin American Test Symposium, 2022
Proceedings of the IEEE International Test Conference, 2022
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.
Proceedings of the IEEE European Test Symposium, 2022
Proceedings of the IEEE European Test Symposium, 2022
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022