Lucas Brusamarello

According to our database, Lucas Brusamarello authored at least 11 papers between 2007 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants.

Gilson I. Wirth, Dragica Vasileska, N. Ashraf, Lucas Brusamarello, R. Della Giustina, P. Srinivasan

Microelectron. Reliab., 2012

2011

Modeling and simulation of device variability and reliability at the electrical level.

Lucas Brusamarello

PhD thesis, 2011

Fast and accurate statistical characterization of standard cell libraries.

Lucas Brusamarello, Gilson I. Wirth, Philippe Roussel, Miguel Miranda

Microelectron. Reliab., 2011

Statistical characterization of standard cells using design of experiments with response surface modeling.

Miguel Miranda, Philippe Roussel, Lucas Brusamarello, Gilson I. Wirth

Proceedings of the 48th Design Automation Conference, 2011

2009

Statistical RTS model for digital circuits.

Lucas Brusamarello, Gilson I. Wirth, Roberto da Silva

Microelectron. Reliab., 2009

NBTI-aware technique for transistor sizing of high-performance CMOS gates.

Maurício Banaszeski da Silva, Vinicius V. A. Camargo, Lucas Brusamarello, Gilson I. Wirth, Roberto da Silva

Proceedings of the 10th Latin American Test Workshop, 2009

2008

Probabilistic Approach for Yield Analysis of Dynamic Logic Circuits.

Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo A. L. Reis

IEEE Trans. Circuits Syst. I Regul. Pap., 2008

2007

Técnicas probabilísticas para análise de yield em nível elétrico usando propagação de erros e derivadas numéricas.

Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo Augusto da Luz Reis

RITA, 2007

Statistical and Numerical Approach for a Computer efficient circuit yield analysis.

Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo Reis

Proceedings of the VLSI-SoC: Advanced Topics on Systems on a Chip, 2007

Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level.

Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo A. L. Reis

Proceedings of the IFIP VLSI-SoC 2007, 2007

Yield Analysis by Error Propagation Using Numerical Derivatives Considering WD and D2D variations.

Lucas Brusamarello, Roberto da Silva, Ricardo A. L. Reis, Gilson I. Wirth

Proceedings of the 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), 2007