Maike Taddiken

According to our database, Maike Taddiken authored at least 15 papers between 2014 and 2019.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2019

Charge-Based Model for Reliability Analysis Flow of Flip- Flops under Process Variation and Aging.

Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 16th International Conference on Synthesis, 2019

2018

Design for reliability of generic sensor interface circuits.

Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen

Microelectron. Reliab., 2018

On-line monitoring and error correction in sensor interface circuits using digital calibration techniques.

Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

ReSeMBleD-Methods for Response Surface Model Behavioral Description.

Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 15th International Conference on Synthesis, 2018

LUT-Based Stochastic Modeling for Non-Normal Performance Distributions.

Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 15th International Conference on Synthesis, 2018

Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability.

Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 15th International Conference on Synthesis, 2018

2017

Variation- and degradation-aware stochastic behavioral modeling of analog circuit components.

Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 14th International Conference on Synthesis, 2017

Behavioral modeling of a sensor interface circuit including various non-idealities.

Sascha Heinssen, Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 14th International Conference on Synthesis, 2017

2016

Analysis of aging effects - From transistor to system level.

Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul

Microelectron. Reliab., 2016

Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process.

Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 2016 MIXDES, 2016

Parameter identification for behavioral modeling of analog components including degradation.

Maike Taddiken, Theodor Hillebrand, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 2016 MIXDES, 2016

Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits.

Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 2016 MIXDES, 2016

Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process.

Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Online monitoring of NBTI and HCD in beta-multiplier circuits.

Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2014

Analog behavioral modeling for age-dependent degradation of complex analog circuits.

Nils Heidmann, Nico Hellwege, Maike Taddiken, Dagmar Peters-Drolshagen, Steffen Paul

Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, 2014