Theodor Hillebrand

According to our database, Theodor Hillebrand authored at least 17 papers between 2016 and 2018.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2018

Design for reliability of generic sensor interface circuits.

Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen

Microelectron. Reliab., 2018

On-line monitoring and error correction in sensor interface circuits using digital calibration techniques.

Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

LUT-Based Stochastic Modeling for Non-Normal Performance Distributions.

Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 15th International Conference on Synthesis, 2018

Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability.

Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 15th International Conference on Synthesis, 2018

Topology-Driven Reliability Assessment of Integrated Circuits.

Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 25th International Conference "Mixed Design of Integrated Circuits and System", 2018

A New Approach to Threshold Voltage Measurements of Transistors.

Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Reliability-Aware Multi-Vth Domain Digital Design Assessment.

Theodor Hillebrand, Ludwig Karsthof, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018

2017

Design and Verification of Analog CMOS Circuits Using the <i>g</i> _m/<i>I</i> _D-Method with Age-Dependent Degradation Effects.

Timur Schafer, Theodor Hillebrand, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul

J. Low Power Electron., 2017

Variation- and degradation-aware stochastic behavioral modeling of analog circuit components.

Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 14th International Conference on Synthesis, 2017

Behavioral modeling of a sensor interface circuit including various non-idealities.

Sascha Heinssen, Maike Taddiken, Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 14th International Conference on Synthesis, 2017

2016

Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects.

Theodor Hillebrand, Timur Schafer, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul

Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016

Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process.

Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 2016 MIXDES, 2016

Parameter identification for behavioral modeling of analog components including degradation.

Maike Taddiken, Theodor Hillebrand, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 2016 MIXDES, 2016

Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits.

Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 2016 MIXDES, 2016

Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process.

Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Online monitoring of NBTI and HCD in beta-multiplier circuits.

Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Reliability-aware design method for CMOS circuits.

Theodor Hillebrand, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016