Nico Hellwege

According to our database, Nico Hellwege authored at least 14 papers between 2013 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Design and Verification of Analog CMOS Circuits Using the <i>g</i> _m/<i>I</i> _D-Method with Age-Dependent Degradation Effects.

Timur Schafer, Theodor Hillebrand, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul

J. Low Power Electron., 2017

2016

Analysis of aging effects - From transistor to system level.

Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul

Microelectron. Reliab., 2016

Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects.

Theodor Hillebrand, Timur Schafer, Nico Hellwege, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul

Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016

Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits.

Theodor Hillebrand, Nico Hellwege, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 2016 MIXDES, 2016

Reliability-aware design method for CMOS circuits.

Theodor Hillebrand, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016

2015

Optimum Operating Points of Transistors with minimal Aging-Aware Sensitivity.

Nico Hellwege, Nils Heidmann, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 28th Symposium on Integrated Circuits and Systems Design, 2015

An aging-aware transistor sizing tool regarding BTI and HCD degradation modes.

Nico Hellwege, Nils Heidmann, Marco Erstling, Dagmar Peters-Drolshagen, Steffen Paul

Proceedings of the 22nd International Conference Mixed Design of Integrated Circuits & Systems, 2015

NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits.

Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Variability-aware aging modeling for reliability analysis of an analog neural measurement system.

Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

Power efficient digital IC design for a medical application with high reliability requirements.

Nasim Pour Aryan, Nils Heidmann, Martin Wirnshofer, Nico Hellwege, Jonas Pistor, Dagmar Peters-Drolshagen, Georg Georgakos, Steffen Paul, Doris Schmitt-Landsiedel

Proceedings of the 24th International Workshop on Power and Timing Modeling, 2014

Analog behavioral modeling for age-dependent degradation of complex analog circuits.

Nils Heidmann, Nico Hellwege, Maike Taddiken, Dagmar Peters-Drolshagen, Steffen Paul

Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, 2014

Modeling of an analog recording system design for ECoG and AP signals.

Nils Heidmann, Nico Hellwege, Tim Hohlein, Thomas Westphal, Dagmar Peters-Drolshagen, Steffen Paul

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Variability-aware gradual aging for generating reliability figures of a neural measurement system.

Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul

Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems, 2013

Reliability analysis for integrated circuit amplifiers used in neural measurement systems.

Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul

Proceedings of the Design, Automation and Test in Europe, 2013