According to our database1, Nico Hellwege authored at least 14 papers between 2013 and 2017.
Legend:Book In proceedings Article PhD thesis Other
Design and Verification of Analog CMOS Circuits Using the <i>g</i> <sub>m</sub>/<i>I</i> <sub>D</sub>-Method with Age-Dependent Degradation Effects.
J. Low Power Electron., 2017
Microelectron. Reliab., 2016
Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects.
Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016
Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits.
Proceedings of the 2016 MIXDES, 2016
Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016
Proceedings of the 28th Symposium on Integrated Circuits and Systems Design, 2015
Proceedings of the 22nd International Conference Mixed Design of Integrated Circuits & Systems, 2015
NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Variability-aware aging modeling for reliability analysis of an analog neural measurement system.
Proceedings of the 20th IEEE European Test Symposium, 2015
Power efficient digital IC design for a medical application with high reliability requirements.
Proceedings of the 24th International Workshop on Power and Timing Modeling, 2014
Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, 2014
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014
Variability-aware gradual aging for generating reliability figures of a neural measurement system.
Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems, 2013
Reliability analysis for integrated circuit amplifiers used in neural measurement systems.
Proceedings of the Design, Automation and Test in Europe, 2013