Nico Hellwege

According to our database1, Nico Hellwege authored at least 14 papers between 2013 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2017
Design and Verification of Analog CMOS Circuits Using the <i>g</i> <sub>m</sub>/<i>I</i> <sub>D</sub>-Method with Age-Dependent Degradation Effects.
J. Low Power Electron., 2017

2016
Analysis of aging effects - From transistor to system level.
Microelectron. Reliab., 2016

Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects.
Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016

Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits.
Proceedings of the 2016 MIXDES, 2016

Reliability-aware design method for CMOS circuits.
Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016

2015
Optimum Operating Points of Transistors with minimal Aging-Aware Sensitivity.
Proceedings of the 28th Symposium on Integrated Circuits and Systems Design, 2015

An aging-aware transistor sizing tool regarding BTI and HCD degradation modes.
Proceedings of the 22nd International Conference Mixed Design of Integrated Circuits & Systems, 2015

NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Variability-aware aging modeling for reliability analysis of an analog neural measurement system.
Proceedings of the 20th IEEE European Test Symposium, 2015

2014
Power efficient digital IC design for a medical application with high reliability requirements.
Proceedings of the 24th International Workshop on Power and Timing Modeling, 2014

Analog behavioral modeling for age-dependent degradation of complex analog circuits.
Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, 2014

Modeling of an analog recording system design for ECoG and AP signals.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013
Variability-aware gradual aging for generating reliability figures of a neural measurement system.
Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems, 2013

Reliability analysis for integrated circuit amplifiers used in neural measurement systems.
Proceedings of the Design, Automation and Test in Europe, 2013


  Loading...