Mandyam-Komar Srinivas

According to our database, Mandyam-Komar Srinivas authored at least 10 papers between 1992 and 1998.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1998

Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits.

Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas

J. Electron. Test., 1998

1997

Flags and Algebra for Sequential Circuit VNR Path Delay Fault Test Generation.

Mandyam-Komar Srinivas, Michael L. Bushnell, Vishwani D. Agrawal

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

1996

Functional test generation for synchronous sequential circuits.

Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

Statistical path delay fault coverage estimation for synchronous sequential circuits.

Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

1995

Functional test generation for non-scan sequential circuits.

Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

Functional test generation for path delay faults.

Mandyam-Komar Srinivas, Vishwani D. Agrawal, Michael L. Bushnell

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

1994

An Improved Deductive Fault Simulator.

P. R. Suresh Kumar, James Jacob, Mandyam-Komar Srinivas, Vishwani D. Agrawal

Proceedings of the Seventh International Conference on VLSI Design, 1994

1993

Efficient Technique to Reduce Gate Evaluations and Speed Up Fault Simulation.

P. R. Suresh Kumar, Mandyam-Komar Srinivas, James Jacob

Proceedings of the Sixth International Conference on VLSI Design, 1993

1992

An Efficient Rule Based Fault Simulator.

Oommen Tharakan, James Jacob, Mandyam-Komar Srinivas

Proceedings of the Fifth International Conference on VLSI Design, 1992

Finite State Machine Testing Based on Growth and Dissappearance Faults.

Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal

Proceedings of the Digest of Papers: FTCS-22, 1992