Manu Rehani

According to our database1, Manu Rehani authored at least 3 papers between 2002 and 2004.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2004
ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2002
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002


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