Kevin Cota

According to our database, Kevin Cota authored at least 7 papers between 2000 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis.

Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2003

Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.

Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort.

W. Robert Daasch, James McNames, Robert Madge, Kevin Cota

IEEE Des. Test Comput., 2002

Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.

Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data.

W. Robert Daasch, Kevin Cota, James McNames, Robert Madge

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Neighbor selection for variance reduction in I_DDQ and other parametric data.

W. Robert Daasch, Kevin Cota, James McNames, Robert Madge

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Variance reduction using wafer patterns in I_ddQ data.

W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000