Robert Madge

According to our database, Robert Madge authored at least 23 papers between 2001 and 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2007

Making Manufacturing Work For You.

Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian

Proceedings of the 44th Design Automation Conference, 2007

2005

New test paradigms for yield and manufacturability.

Robert Madge

IEEE Des. Test Comput., 2005

Defect Screening Using Independent Component Analysis on I_DDQ.

Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis.

Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

The value of statistical testing for quality, yield and test cost improvement.

Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Data-driven models for statistical testing: measurements, estimates and residuals.

W. Robert Daasch, Robert Madge

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Variance reduction and outliers: statistical analysis of semiconductor test data.

W. Robert Daasch, Robert Madge

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Detection of Temperature Sensitive Defects Using ZTC.

Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test.

Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.

Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

ATE Value Add through Open Data Collection.

Robert Madge

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.

Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.

Robert Madge, Brady Benware, W. Robert Daasch

IEEE Des. Test Comput., 2003

Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs.

Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.

Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Impact of Multiple-Detect Test Patterns on Product Quality.

Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Creating Value Through Test.

Erik Jan Marinissen, Bart Vermeulen, Robert Madge, Michael Kessler, Michael Müller

Proceedings of the 2003 Design, 2003

2002

Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort.

W. Robert Daasch, James McNames, Robert Madge, Kevin Cota

IEEE Des. Test Comput., 2002

Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.

Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Isolating and Removing Sources of Variation in Test Data.

David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Screening MinVDD Outliers Using Feed-Forward Voltage Testing.

Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data.

W. Robert Daasch, Kevin Cota, James McNames, Robert Madge

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Neighbor selection for variance reduction in I_DDQ and other parametric data.

W. Robert Daasch, Kevin Cota, James McNames, Robert Madge

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001