Matteo Dal Lago

According to our database, Matteo Dal Lago authored at least 10 papers between 2011 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Failure causes and mechanisms of retrofit LED lamps.

Carlo De Santi, Matteo Dal Lago, Matteo Buffolo, Desiree Monti, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2015

Effects and exploitation of tunable white light for circadian rhythm and human-centric lighting.

Nicola Trivellin, Matteo Meneghini, Marco Ferretti, Diego Barbisan, Matteo Dal Lago, Gaudenzio Meneghesso, Enrico Zanoni

Proceedings of the 1st IEEE International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow, 2015

Analysis of the mechanisms limiting the reliability of retrofit LED lamps.

Carlo De Santi, Matteo Dal Lago, Matteo Buffolo, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni

Proceedings of the 1st IEEE International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow, 2015

2014

ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements.

Matteo Meneghini, Simone Vaccari, Matteo Dal Lago, Stefano Marconi, Marco Barbato, Nicola Trivellin, Alessio Griffoni, Alberto Alfier, Giovanni Verzellesi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2014

ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms.

Matteo Dal Lago, Matteo Meneghini, Carlo De Santi, Marco Barbato, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2014

2013

"Hot-plugging" of LED modules: Electrical characterization and device degradation.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2013

2012

Chip and package-related degradation of high power white LEDs.

Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress.

Matteo Meneghini, Matteo Dal Lago, L. Rodighiero, Nicola Trivellin, Enrico Zanoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2012

Phosphors for LED-based light sources: Thermal properties and reliability issues.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

2011

Degradation mechanisms of high-power white LEDs activated by current and temperature.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2011