Nicola Trivellin

According to our database, Nicola Trivellin authored at least 19 papers between 2009 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

Autonomous IoT Monitoring Matching Spectral Artificial Light Manipulation for Horticulture.

Irene Cappelli, Ada Fort, Alessandro Pozzebon, Marco Tani, Nicola Trivellin, Valerio Vignoli, Mara Bruzzi

Sensors, 2022

2021

Full Optical Contactless Thermometry Based on LED Photoluminescence.

Nicola Trivellin, Matteo Buffolo, Carlo De Santi, Matteo Meneghini, Michele Forzan, Fabrizio Dughiero, Enrico Zanoni, Gaudenzio Meneghesso

IEEE Trans. Instrum. Meas., 2021

Current crowding as a major cause for InGaN LED degradation at extreme high current density.

Nicola Trivellin, Matteo Buffolo, Carlo De Santi, Enrico Zanoni, Gaudenzio Meneghesso, Matteo Meneghini

Proceedings of the IECON 2021, 2021

2018

Study and Development of a Fluorescence Based Sensor System for Monitoring Oxygen in Wine Production: The WOW Project.

Nicola Trivellin, Diego Barbisan, Denis Badocco, Paolo Pastore, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni, Giuseppe Belgioioso, Angelo Cenedese

Sensors, 2018

Current induced degradation study on state of the art DUV LEDs.

Nicola Trivellin, Desiree Monti, Carlo De Santi, Matteo Buffolo, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Microelectron. Reliab., 2018

2015

Effects and exploitation of tunable white light for circadian rhythm and human-centric lighting.

Nicola Trivellin, Matteo Meneghini, Marco Ferretti, Diego Barbisan, Matteo Dal Lago, Gaudenzio Meneghesso, Enrico Zanoni

Proceedings of the 1st IEEE International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow, 2015

2014

Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage.

Carlo De Santi, Matteo Meneghini, Michael Marioli, Matteo Buffolo, Nicola Trivellin, T. Weig, K. Holc, K. Köhler, J. Wagner, U. T. Schwarz, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2014

ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements.

Matteo Meneghini, Simone Vaccari, Matteo Dal Lago, Stefano Marconi, Marco Barbato, Nicola Trivellin, Alessio Griffoni, Alberto Alfier, Giovanni Verzellesi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2014

ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms.

Matteo Dal Lago, Matteo Meneghini, Carlo De Santi, Marco Barbato, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2014

2013

Variations in junction capacitance and doping activation associated with electrical stress of InGaN/GaN laser diodes.

Carlo De Santi, Matteo Meneghini, S. Carraro, Simone Vaccari, Nicola Trivellin, Stefania Marconi, Michael Marioli, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2013

"Hot-plugging" of LED modules: Electrical characterization and device degradation.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2013

2012

Chip and package-related degradation of high power white LEDs.

Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress.

Matteo Meneghini, Matteo Dal Lago, L. Rodighiero, Nicola Trivellin, Enrico Zanoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2012

Phosphors for LED-based light sources: Thermal properties and reliability issues.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

2011

Extensive study of reliability and performance of next generation GaN light emitting devices.

Nicola Trivellin

PhD thesis, 2011

Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency.

Nicola Trivellin, Matteo Meneghini, Carlo De Santi, Simone Vaccari, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, S. Takigawa, Tsuyoshi Tanaka, Daisuke Ueda

Microelectron. Reliab., 2011

Degradation mechanisms of high-power white LEDs activated by current and temperature.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2011

2010

Reliability evaluation for Blu-Ray laser diodes.

Matteo Meneghini, Nicola Trivellin, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda, Enrico Zanoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2010

2009

Reliability analysis of InGaN Blu-Ray laser diode.

Nicola Trivellin, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda

Microelectron. Reliab., 2009