Giovanna Mura

According to our database, Giovanna Mura authored at least 30 papers between 2002 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films.

Giorgio Montisci, Giovanna Mura, Giacomo Muntoni, Giovanni Andrea Casula, Francesco Paolo Chietera, Mahmoud Aburish-Hmidat

IEEE Access, 2023

2018

Further improvements of an extended Hakki-Paoli method.

Massimo Vanzi, Giovanna Mura, G. Martines

Microelectron. Reliab., 2018

Reliability concerns from the gray market.

Giovanna Mura

Microelectron. Reliab., 2018

2017

Practical optical gain by an extended Hakki-Paoli method.

Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou

Microelectron. Reliab., 2017

Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities.

Riccardo Enrici Vaion, Matteo Medda, Alberto Mancaleoni, Giovanna Mura, A. Pintus, M. De Tomasi

Microelectron. Reliab., 2017

2016

ESD tests on 850 nm GaAs-based VCSELs.

Massimo Vanzi, Giovanna Mura, Giulia Marcello, Kunhui Xiao

Microelectron. Reliab., 2016

Single Event Transient acquisition and mapping for space device Characterization.

Roberta Pilia, Guillaume Bascoul, Kevin Sanchez, Giovanna Mura, Fulvio Infante

Microelectron. Reliab., 2016

2015

Clamp voltage and ideality factor in laser diodes.

Massimo Vanzi, Giovanna Mura, Giulia Marcello, G. Martines

Microelectron. Reliab., 2015

Stress-induced instabilities of shunt paths in high efficiency MWT solar cells.

Marco Barbato, Matteo Meneghini, Andrea Cester, Alessandro Barbato, Enrico Zanoni, Gaudenzio Meneghesso, Giovanna Mura, D. Tonini, A. Voltan, Giorgio Cellere

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

FIB-induced electro-optical alterations in a DFB InP laser diode.

Giovanna Mura, Massimo Vanzi, Giulia Marcello

Microelectron. Reliab., 2014

2013

Optical losses in single-mode laser diodes.

Massimo Vanzi, Giovanna Mura, M. Marongiu, T. Tomasi

Microelectron. Reliab., 2013

The role of the optical trans-characteristics in laser diode analysis.

Giovanna Mura, Massimo Vanzi, Giulia Marcello, Robert Cao

Microelectron. Reliab., 2013

"Hot-plugging" of LED modules: Electrical characterization and device degradation.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2013

Thermal and electrical investigation of the reverse bias degradation of silicon solar cells.

Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2013

2012

Chip and package-related degradation of high power white LEDs.

Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

MIM capacitor-related early-stage field failures.

Jia Lu, BoCheng Cao, WenShe Wu, YuFeng Dai, ChuangJun Huang, Giovanna Mura

Microelectron. Reliab., 2012

Phosphors for LED-based light sources: Thermal properties and reliability issues.

Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

2011

DC parameters for laser diodes from experimental curves.

Massimo Vanzi, Giovanna Mura, G. Martines

Microelectron. Reliab., 2011

2010

The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis.

Giovanna Mura, Massimo Vanzi

Microelectron. Reliab., 2010

2009

Lot reliability issues in commercial off the shelf (COTS) microelectronic devices.

Giovanna Mura, Massimo Vanzi

Microelectron. Reliab., 2009

2008

Sulfur-contamination of high power white LED.

Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi

Microelectron. Reliab., 2008

2007

High temperature electro-optical degradation of InGaN/GaN HBLEDs.

Matteo Meneghini, Lorenzo Trevisanello, C. Sanna, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2007

2006

Failure Analysis-assisted FMEA.

G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano

Microelectron. Reliab., 2006

2005

Reliability predictions in electronic industrial applications.

G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini

Microelectron. Reliab., 2005

2004

Failure analysis of RFIC amplifiers.

Giovanna Mura, Massimo Vanzi, G. Micheletti

Microelectron. Reliab., 2004

2003

On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices.

Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner

Microelectron. Reliab., 2003

Reliability of visible GaN LEDs in plastic package.

Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, Gaetano Scamarcio, Giovanna Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich

Microelectron. Reliab., 2003

2002

ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology.

Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2002

Backside Failure Analysis of GaAs ICs after ESD tests.

Gaudenzio Meneghesso, A. Cocco, Giovanna Mura, Simona Podda, Massimo Vanzi

Microelectron. Reliab., 2002

An automated lifetest equipment for optical emitters.

M. Giglio, G. Martines, Giovanna Mura, Simona Podda, Massimo Vanzi

Microelectron. Reliab., 2002