Mattia Borgarino

Orcid: 0000-0001-9678-592X

According to our database1, Mattia Borgarino authored at least 14 papers between 2001 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2019
Clock-less 8-bit SAR-ADC with delay-line based digital control circuit.
Microelectron. J., 2019

2016
An ULP and very efficient adaptively biased LDO regulator for harvesting application.
Proceedings of the 14th IEEE International New Circuits and Systems Conference, 2016

2014
A low power Ku phase locked oscillator in low cost 130 nm CMOS technology.
Microelectron. J., 2014

On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization.
Microelectron. J., 2014

2009
A 130nm CMOS tunable digital frequency divider for dual-band microwave radiometer.
Proceedings of the 16th IEEE International Conference on Electronics, 2009

A 5.2mW ku-band CMOS injection-locked frequency doubler with differential input / output.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2009

2008
A broadband RF 65 nm CMOS front-end for cable TV reception.
Microelectron. J., 2008

SiGe BiCMOS X-Band integrated radiometer.
Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008

System-on-chip microwave radiometer for thermal remote sensing and its application to the forest fire detection.
Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008

2006
High linearity CMOS mixer for domotic 5GHz WLAN sliding-IF receivers.
Microelectron. J., 2006

2003
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's.
Microelectron. Reliab., 2003

2002
Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications.
Microelectron. Reliab., 2002

2001
Gate-lag effects in AlGaAs/GaAs power HFET's.
Microelectron. Reliab., 2001

Reliability physics of compound semiconductor transistors for microwave applications.
Microelectron. Reliab., 2001


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