Michael C. W. Coln

According to our database, Michael C. W. Coln authored at least 15 papers between 1985 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

A 1-V 560-nW SAR ADC With 90-dB SNDR for IoT Sensing Applications.

Huajun Zhang, Zhichao Tan, Chao Chu, Baozhen Chen, Hongxing Li, Michael C. W. Coln, Khiem Nguyen

IEEE Trans. Circuits Syst. II Express Briefs, 2019

2018

A 16-bit 16-MS/s SAR ADC With On-Chip Calibration in 55-nm CMOS.

Junhua Shen, Akira Shikata, Lalinda Fernando, Ned Guthrie, Baozhen Chen, Mark Maddox, Nikhil Mascarenhas, Ron Kapusta, Michael C. W. Coln

IEEE J. Solid State Circuits, 2018

Corrections to "Precision Passive-Charge-Sharing SAR ADC: Analysis, Design, and Measurement Results".

Baozhen Chen, Mark Maddox, Michael C. W. Coln, Ye Lu, Junhua Shen, Lalinda D. Fernando

IEEE J. Solid State Circuits, 2018

Precision Passive-Charge-Sharing SAR ADC: Analysis, Design, and Measurement Results.

Baozhen Chen, Mark Maddox, Michael C. W. Coln, Ye Lu, Junhua Shen, Lalinda Fernando

IEEE J. Solid State Circuits, 2018

A signal-independent background-calibrating 20b 1MS/S SAR ADC with 0.3ppm INL.

Hongxing Li, Mark Maddox, Michael C. W. Coln, William Buckley, Derek Hummerston, Naveed Naeem

Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018

2016

A 16 bit linear passive-charge-sharing SAR ADC in 55nm CMOS.

Mark Maddox, Baozhen Chen, Michael C. W. Coln, Ron Kapusta, Junhua Shen, Lalinda Fernando

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2016

2013

A 20b Clockless DAC With Sub-ppm INL, 7.5 nV/√Hz Noise and 0.05 ppm/°C Stability.

Roddy C. McLachlan, Alan Gillespie, Michael C. W. Coln, Douglas Chisholm, Denise T. Lee

IEEE J. Solid State Circuits, 2013

A 20b clockless DAC with sub-ppm-linearity 7.5nV/vHz-noise and 0.05ppm/°C-stability.

Roddy C. McLachlan, Alan Gillespie, Michael C. W. Coln, Douglas Chisholm, Denise T. Lee

Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

Split ADC background self-calibration of a 16-b successive approximation ADC in 180nm CMOS.

John A. McNeill, Christopher L. David, Michael C. W. Coln, Ka Yan Chan, Cody Brenneman

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

2011

All-Digital Background Calibration of a Successive Approximation ADC Using the "Split ADC" Architecture.

John A. McNeill, Ka Yan Chan, Michael C. W. Coln, Christopher L. David, Cody Brenneman

IEEE Trans. Circuits Syst. I Regul. Pap., 2011

2009

"Split ADC" Calibration for All-Digital Correction of Time-Interleaved ADC Errors.

John A. McNeill, Christopher L. David, Michael C. W. Coln, Rosa Croughwell

IEEE Trans. Circuits Syst. II Express Briefs, 2009

Digital Background-Calibration Algorithm for "Split ADC" Architecture.

John A. McNeill, Michael C. W. Coln, D. Richard Brown, Brian J. Larivee

IEEE Trans. Circuits Syst. I Regul. Pap., 2009

2006

Comments on 'Split ADC' architecture for deterministic digital background calibration of a 16-bit 1-MS/s ADC".

Jipeng Li, Un-Ku Moon, John A. McNeill, Michael C. W. Coln, Brian J. Larivee

IEEE J. Solid State Circuits, 2006

2005

"Split ADC" architecture for deterministic digital background calibration of a 16-bit 1-MS/s ADC.

John A. McNeill, Michael C. W. Coln, Brian J. Larivee

IEEE J. Solid State Circuits, 2005

1985

A high performance dielectric measurement system.

Michael Christian Wohnsen Coln

PhD thesis, 1985