Michael Goroll

According to our database1, Michael Goroll authored at least 11 papers between 2004 and 2014.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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PhD thesis 
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Links

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Bibliography

2014
Acoustic detection of micro-cracks in small electronic devices.
Microelectron. Reliab., 2014

2012
Degradation of moulding compounds during highly accelerated stress tests - A simple approach to study adhesion by performing button shear tests.
Microelectron. Reliab., 2012

Determination of adhesion and delamination prediction for semiconductor packages by using Grey Scale Correlation and Cohesive Zone Modelling.
Microelectron. Reliab., 2012

2010
New aspects in characterization of adhesion of moulding compounds on different surfaces by using a simple button-shear-test method for lifetime prediction of power devices.
Microelectron. Reliab., 2010

2008
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications.
Microelectron. Reliab., 2008

New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure.
Microelectron. Reliab., 2008

NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique.
Microelectron. Reliab., 2008

2007
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices.
Microelectron. Reliab., 2007

Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors.
Microelectron. Reliab., 2007

2006
ESD protection structure qualification - a new approach for release for automotive applications.
Microelectron. Reliab., 2006

2004
Semiconductors in high temperature applications - a future trend in automotive industry.
Microelectron. Reliab., 2004


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