Michael J. Mutch

According to our database, Michael J. Mutch authored at least 1 paper in 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2016

Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability.

Michael J. Mutch, Thomas Pomorski, Brad C. Bittel, Corey J. Cochrane, Patrick M. Lenahan, Xin Liu, Robert J. Nemanich, Justin Brockman, Marc French, Markus Kuhn, Benjamin French, Sean W. King

Microelectron. Reliab., 2016