Patrick M. Lenahan
According to our database1,
Patrick M. Lenahan authored at least 8 papers
between 2007 and 2025.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2010, "For contributions to understanding of radiation damage and reliabilityof metal-oxide semiconductor devices".
Timeline
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Bibliography
2025
Detection of Surface Spins Causing Flux Noise in Quantum Devices Using Electron Spin Resonance.
Proceedings of the IEEE International Conference on Quantum Computing and Engineering, 2025
2023
Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Reliability and Performance Issues in SiC MOSFETs: Insight Provided by Spin Dependent Recombination.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Bias temperature instabilities in 4H SiC metal oxide semiconductor field effect transistors: Insight provided by electrically detected magnetic resonance.
Microelectron. Reliab., 2018
2016
Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability.
Microelectron. Reliab., 2016
2015
Negative bias instability in 4H-SiC MOSFETS: Evidence for structural changes in the SiC.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2007
Microelectron. Reliab., 2007