Michael J. Ohletz

According to our database, Michael J. Ohletz authored at least 13 papers between 1985 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Design, qualification and production of integrated sensor interface circuits for high-quality automotive applications.

Michael J. Ohletz, F. Schulze

Microelectron. J., 2009

2003

Floating body effects model for fault simulation of fully depleted CMOS/SOI circuits.

Daniela De Venuto, Michael J. Ohletz

Microelectron. J., 2003

Automatic Repositioning Technique for Digital Cell Based Window Comparators and Implementation within Mixed-Signal DfT Schemes.

Daniela De Venuto, Michael J. Ohletz, Bruno Riccò

Proceedings of the 4th International Symposium on Quality of Electronic Design (ISQED 2003), 2003

Self-positioning digital window comparators for mixed-signal DfT.

Daniela De Venuto, Michael J. Ohletz, Bruno Riccò

Proceedings of 9th IEEE International Conference on Emerging Technologies and Factory Automation, 2003

2002

Digital Window Comparator DfT Scheme for Mixed-Signal ICs.

Daniela De Venuto, Michael J. Ohletz, Bruno Riccò

J. Electron. Test., 2002

Testing of Analogue Circuits via (Standard) Digital Gates.

Daniela De Venuto, Michael J. Ohletz, Bruno Riccò

Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002

2001

On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages.

Daniela De Venuto, Michael J. Ohletz

J. Electron. Test., 2001

2000

Static and dynamic on-chip test response evaluation using a two-mode comparator.

Daniela De Venuto, Michael J. Ohletz, G. Matarrese

Proceedings of the 5th European Test Workshop, 2000

1998

A Design for Testability Study on a High Performance Automatic Gain Control Circuit.

Andreas Lechner, Andrew Richardson, B. Hermes, Michael J. Ohletz

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Defect-oriented testing of analogue and mixed signal ICs.

Marcelino B. Santos, Fernando M. Gonçalves, Michael J. Ohletz, João Paulo Teixeira

Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998

1996

Realistic-Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits.

Michael J. Ohletz

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits.

Christian Sebeke, J. P. Teixeira, Michael J. Ohletz

Proceedings of the 1995 European Design and Test Conference, 1995

1985

Test of Digital Transversal Filters.

F. Matthiesen, Michael J. Ohletz

Proceedings of the Proceedings International Test Conference 1985, 1985