Michael Sekyere

According to our database, Michael Sekyere authored at least 13 papers between 2022 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Matching Critical Analog Circuit Components Up To Third-Order Gradients for All Possible Exact Matching Ratios.

Michael Sekyere, Isaac Bruce, Ruohan Yang, Degang Chen, Colin C. McAndrew, Xiankun Jin, Chen He, Doug Garrity

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., March, 2025

Robust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry.

Michael Sekyere, Marampally Saikiran, Rob Butler, Reed Adams, Degang Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2025

Signal Flow Graph Analysis of Analog Circuits using Principles of Control Theory : Tutorial Review.

Michael Sekyere, Marampally Saikiran, Degang Chen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2025

Digital Defect Oriented Test Method for Phase Locked Loops with High Coverage.

Michael Sekyere, Marampally Saikiran, Godfred Bonsu, Kelvin W. Tamakloe, Rob Butler, Reed Adams, Degang Chen

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2025

2024

Invited Paper: Low Power, Fully-Integrated Flipped Voltage Follower LDO Using Off-State Non-Linear Circuits for Enhanced Transient Performance.

Michael Sekyere, Degang Chen

Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs.

Saeid Karimpour, Isaac Bruce, Michael Sekyere, Ruohan Yang, Emmanuel Nti Darko, Degang Chen

Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024

Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm.

Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024

2023

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm.

Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm.

Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers.

Michael Sekyere, Marampally Saikiran, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency.

Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview.

Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen

Proceedings of the IEEE East-West Design & Test Symposium, 2023

2022

All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage.

Michael Sekyere, Marampally Saikiran, Degang Chen

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022