Mudasir Kawoosa

According to our database, Mudasir Kawoosa authored at least 3 papers between 2013 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Towards Single Pin Scan for Extremely Low Pin Count Test.

Mudasir S. Kawoosa, Rajesh K. Mittal, Maheedhar Jalasuthram, Rubin A. Parekhji

Proceedings of the 31st International Conference on VLSI Design and 17th International Conference on Embedded Systems, 2018

2014

Systematic approach for trim test time optimization: Case study on a multi-core RF SOC.

Rajesh Mittal, Mudasir Kawoosa, Rubin A. Parekhji

Proceedings of the 2014 International Test Conference, 2014

2013

Towards adaptive test of multi-core RF SoCs.

Rajesh Mittal, Lakshmanan Balasubramanian, Y. B. Chethan Kumar, V. R. Devanathan, Mudasir Kawoosa, Rubin A. Parekhji

Proceedings of the Design, Automation and Test in Europe, 2013