Mykola Blyzniuk

According to our database1, Mykola Blyzniuk
  • authored at least 2 papers in 2001.
  • has a "Dijkstra number"2 of five.

Timeline

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Bibliography

2001
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement.
Microelectronics Reliability, 2001

Development of the Special Software Tools for the Defect/Fault Analysis in the Complex Gates from Standard Cell Library.
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001


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