Witold A. Pleskacz

Proceedings of the 30th International Conference on Mixed Design of Integrated Circuits and System, 2023

2022

Clock Signal Phase Alignment System for Daisy Chained Integrated Circuits.

[BibT_eX]

[DOI]

Andrzej A. Wojciechowski

Proceedings of the 29th International Conference on Mixed Design of Integrated Circuits and System, 2022

DC/DC Buck Converter Soft-Start Methods.

[BibT_eX]

[DOI]

Adam Borkowski

Proceedings of the 29th International Conference on Mixed Design of Integrated Circuits and System, 2022

2021

Class AB Operational Amplifier in CMOS 55 nm Technology.

[BibT_eX]

[DOI]

Pawel Pienczuk

Mateusz Teodorowski

Proceedings of the 2021 28th International Conference on Mixed Design of Integrated Circuits and System, 2021

2020

GNSS-ISE: Instruction Set Extension for GNSS Baseband Processing.

[BibT_eX]

[DOI]

Sensors, 2020

Erratum: Borejko, T., et al. NaviSoC: High-Accuracy Low-Power GNSS SoC with an Integrated Application Processor. Sensors 2020, 20, 1069.

[BibT_eX]

[DOI]

Sensors, 2020

NaviSoC: High-Accuracy Low-Power GNSS SoC with an Integrated Application Processor.

[BibT_eX]

[DOI]

Sensors, 2020

CMOS Differential Amplifier as a Physically Unclonable Function.

[BibT_eX]

[DOI]

Szymon Reszewicz

Proceedings of the 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2020

2019

Configurable MBIST Processor for Embedded Memories Testing.

[BibT_eX]

[DOI]

Andrzej A. Wojciechowski

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

Implementation and Comparison of SPA and DPA Countermeasures for Elliptic Curve Point Multiplication.

[BibT_eX]

[DOI]

Lukasz Ostrowski

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

Design and Verification Environment for RISC-V Processor Cores.

[BibT_eX]

[DOI]

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

Retargeting the MIPS-II CPU Core to the RISC-V Architecture.

[BibT_eX]

[DOI]

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

DC/DC Buck Converter with Build-in Tuned Sawtooth Wave Generator Using CMOS Technology.

[BibT_eX]

[DOI]

Adam Borkowski

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

International Symposium on Design and Diagnostics of Electronic Circuits and Systems.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2019

Design of a True Random Number Generator Based on Low Power Oscillator with Increased Jitter.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019

2018

Foreword to the special issue on 20th IEEE international symposium on design and diagnostics of electronic circuits and systems (DDECS2017).

[BibT_eX]

[DOI]

Zoran Stamenkovic

Ondrej Novák

Microelectron. Reliab., 2018

Design of a Wideband Low Noise Amplifier for a FMCW Synthetic Aperture Radar in 130 nm SiGe BiCMOS Technology.

[BibT_eX]

[DOI]

Proceedings of the 25th International Conference "Mixed Design of Integrated Circuits and System", 2018

Ka Band Digitally Controlled Oscillator for FMCW Radar in 130 nm SiGe BiCMOS Technology.

[BibT_eX]

[DOI]

Proceedings of the 25th International Conference "Mixed Design of Integrated Circuits and System", 2018

2.4 GHz LC-VCO with Improved Robustness against PVT Using FD-SOI Body Biasing Technique.

[BibT_eX]

[DOI]

Szymon Reszewicz

Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018

2017

EIA/TIA-485 transceiver in standard 130 nm CMOS technology.

[BibT_eX]

[DOI]

Michal Wysocki

Proceedings of the 24th International Conference Mixed Design of Integrated Circuits and Systems, 2017

Importance of on-chip inductor modeling in radio frequency integrated circuits.

[BibT_eX]

[DOI]

Proceedings of the 24th International Conference Mixed Design of Integrated Circuits and Systems, 2017

Temperature calibration technique based on on-chip resistor.

[BibT_eX]

[DOI]

Pawel Narczyk

Proceedings of the 24th International Conference Mixed Design of Integrated Circuits and Systems, 2017

Principal component analysis of accelerations in human dynamic movements: A sample set length effect study.

[BibT_eX]

[DOI]

Konrad Neneman

Proceedings of the 24th International Conference Mixed Design of Integrated Circuits and Systems, 2017

Analog front-end for precise human body temperature measurement.

[BibT_eX]

[DOI]

Pawel Narczyk

Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

2016

Architecture and design of a Bluetooth Low Energy Controller.

[BibT_eX]

[DOI]

Proceedings of the 2016 MIXDES, 2016

Monitoring of dynamic movements using acceleration measurements.

[BibT_eX]

[DOI]

Konrad Neneman

Proceedings of the 2016 MIXDES, 2016

A low sampling frequency switched capacitor low-pass filter for wireless receivers.

[BibT_eX]

[DOI]

Proceedings of the 2016 MIXDES, 2016

The integrated transmitter and receiver modules for pulse oximeter system.

[BibT_eX]

[DOI]

Proceedings of the 2016 MIXDES, 2016

New architecture of the object-oriented functional coverage mechanism for digital verification.

[BibT_eX]

[DOI]

Marek Cieplucha

Proceedings of the 1st IEEE International Verification and Security Workshop, 2016

Dedicated chip for pulse oximetry measurements.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

BioSoC: Highly integrated System-on-Chip for health monitoring.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

Precision human body temperature measurement based on thermistor sensor.

[BibT_eX]

[DOI]

Pawel Narczyk

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

Integer-N phase locked loop for bluetooth receiver in CMOS 130 nm technology.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

2015

A CMOS system-on-chip for physiological parameters acquisition, processing and monitoring.

[BibT_eX]

[DOI]

Proceedings of the 22nd International Conference Mixed Design of Integrated Circuits & Systems, 2015

Low voltage LNA implementations in 28 nm FD-SOI technology for GNSS applications.

[BibT_eX]

[DOI]

Aleh Halauko

Proceedings of the 22nd International Conference Mixed Design of Integrated Circuits & Systems, 2015

IF polyphase filter design and calibration with back-gate biasing in 28 nm FD-SOI technology.

[BibT_eX]

[DOI]

Mariusz Derlecki

Proceedings of the 22nd International Conference Mixed Design of Integrated Circuits & Systems, 2015

UVM-based Verification of Bluetooth Low Energy Controller.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

Implementation of the ADELITE Microcontroller for Biomedical Applications.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

A Low Ripple Current Mode Voltage Doubler.

[BibT_eX]

[DOI]

Andrzej Grodzicki

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

Simulink model of GFSK demodulator based on time-to-digital converter.

[BibT_eX]

[DOI]

Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, 2014

Implementation of the Bluetooth receiver RF front-end in the CMOS-RF 130 nm technology.

[BibT_eX]

[DOI]

Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems, 2014

Multistage low ripple charge pump.

[BibT_eX]

[DOI]

Andrzej Grodzicki

Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014

2013

ELEON3LP - Superscalar and low-power enhancements of single issue general purpose processor model.

[BibT_eX]

[DOI]

Microprocess. Microsystems, 2013

Intermediate frequency filter calibration method for radio frequency receivers in modern CMOS technologies.

[BibT_eX]

[DOI]

Aleksander Koter

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012

LC-VCO design automation tool for nanometer CMOS technology.

[BibT_eX]

[DOI]

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

AGATE - towards designing a low-power chip multithreading processor for mobile software defined radio systems.

[BibT_eX]

[DOI]

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011

CAD tool for PLL Design.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

PVT tolerant LC-VCO in 90 nm CMOS technology for GPS/Galileo applications.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

A resistorless current reference source for 65 nm CMOS technology with low sensitivity to process, supply voltage and temperature variations.

[BibT_eX]

[DOI]

Michal Lukaszewicz

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

A 5Gb/s equalizer for USB 3.0 receiver in 65 nm CMOS technology.

[BibT_eX]

[DOI]

Jakub Kopanski

Dariusz Pienkowski

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

2010

A comparison of low voltage LNA architectures designed for multistandard GNSS in two 90 nm CMOS technologies.

[BibT_eX]

[DOI]

Jacek Gradzki

Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010

2009

Enhanced LEON3 core for superscalar processing.

[BibT_eX]

[DOI]

Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009

MDCT / IMDCT low power implementations in 90 nm CMOS technology for MP3 audio.

[BibT_eX]

[DOI]

Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009

Low voltage LNA implementations in 90 nm CMOS technology for multistandard GNSS.

[BibT_eX]

[DOI]

Jacek Gradzki

Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009

2008

DefSim: A Remote Laboratory for Studying Physical Defects in CMOS Digital Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Electron., 2008

Characterization of CMOS sequential standard cells for defect based voltage testing.

[BibT_eX]

[DOI]

Andrzej Wielgus

Proceedings of the 2008 East-West Design & Test Symposium, 2008

Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC.

[BibT_eX]

[DOI]

Proceedings of the 11th Euromicro Conference on Digital System Design: Architectures, 2008

Controllable Local Clock Signal Generator for Deep Submicron GALS Architectures.

[BibT_eX]

[DOI]

Artur L. Sobczyk

Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

Various MDCT implementations in 0.35µm CMOS.

[BibT_eX]

[DOI]

Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

A Resistorless Voltage Reference Source for 90 nm CMOS Technology with Low Sensitivity to Process and Temperature Variations.

[BibT_eX]

[DOI]

Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology.

[BibT_eX]

[DOI]

Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

2007

Power Dissipation in Basic Global Clock Distribution Networks.

[BibT_eX]

[DOI]

Artur L. Sobczyk

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

ESD Failures of Integrated Circuits and Their Diagnostics Using Transmission Line Pulsing.

[BibT_eX]

[DOI]

Zbigniew Piatek

Jerzy F. Kolodziejski

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

Layout to Logic Defect Analysis for Hierarchical Test Generation.

[BibT_eX]

[DOI]

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

2006

DefSim: CMOS Defects on Chip for Research and Education.

[BibT_eX]

Proceedings of the 7th Latin American Test Workshop, 2006

2005

DOT: new deterministic defect-oriented ATPG tool.

[BibT_eX]

[DOI]

Proceedings of the 10th European Test Symposium, 2005

Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs.

[BibT_eX]

[DOI]

Proceedings of the Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August, 2005

2003

Improvement of integrated circuit testing reliability by using the defect based approach.

[BibT_eX]

[DOI]

Dominik Kasprowicz

Microelectron. Reliab., 2003

2002

Hierarchical test generation for combinational circuits with real defects coverage.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2002

CMOS Standard Cells Characterization for IDDQ Testing.

[BibT_eX]

[DOI]

Wieslaw Kuzmicz

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

2001

Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2001

Defect-Oriented Fault Simulation and Test Generation in Digital Circuits.

[BibT_eX]

[DOI]

Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001

CMOS Standard Cells Characterization for Defect Based Testing.

[BibT_eX]

[DOI]

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

2000

Hierarchical defect-oriented fault simulation for digital circuits.

[BibT_eX]

[DOI]

Proceedings of the 5th European Test Workshop, 2000

Graphical user interface of FIESTA - software for faults identification and estimation of testability of VLSI circuits.

[BibT_eX]

[DOI]

Proceedings of the Symposium on Contemporary Computing in Ukraine, 2000

1999

A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits.

[BibT_eX]

[DOI]

Charles H. Ouyang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

Yield Estimation of VLSI Circuits with Downscaled Layouts.

[BibT_eX]

[DOI]

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

1997

Detection of Yield Trends.

[BibT_eX]

[DOI]

Hans T. Heineken

Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

Improved Yield Model for Submicron Domain.

[BibT_eX]

[DOI]

Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

CAD at the Design-Manufacturing Interface.

[BibT_eX]

[DOI]

Proceedings of the 34st Conference on Design Automation, 1997

1996

Extraction of critical areas for opens in large VLSI circuits.

[BibT_eX]

[DOI]

Charles H. Ouyang

Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996

1995

SENSAT-a practical tool for estimation of the IC layout sensitivity to spot defects.

[BibT_eX]

[DOI]