Nasr-Eddine Ouldei Tebina

According to our database, Nasr-Eddine Ouldei Tebina authored at least 6 papers between 2022 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2025

Veritas-PUF: A Countermeasure against X-Ray Tampering and Side Channel Attacks.

Nasr-Eddine Ouldei Tebina, Luc Salvo, Marc Xander Makkes, Nacer-Eddine Zergainoh, Paolo Maistri

Proceedings of the 34th IEEE Asian Test Symposium, 2025

2024

Non-Invasive Attack on Ring Oscillator-Based PUFs Through Localized X-Ray Irradiation.

Nasr-Eddine Ouldei Tebina, Aghiles Douadi, Luc Salvo, Vincent Beroulle, Nacer-Eddine Zergainoh, Guillaume Hubert, Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Maistri

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2024

Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification.

Nasr-Eddine Ouldei Tebina, Luc Salvo, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023

Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection.

Nasr-Eddine Ouldei Tebina, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

Simulation Methodology for Assessing X-Ray Effects on Digital Circuits.

Nasr-Eddine Ouldei Tebina, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2022

X-Ray Fault Injection: Reviewing Defensive Approaches from a Security Perspective.

Nasr-Eddine Ouldei Tebina, Nacer-Eddine Zergainoh, Paolo Maistri

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022