Nasr-Eddine Ouldei Tebina

Orcid: 0009-0002-4897-3066

According to our database1, Nasr-Eddine Ouldei Tebina authored at least 3 papers between 2022 and 2023.

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Bibliography

2023
Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection.
Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

Simulation Methodology for Assessing X-Ray Effects on Digital Circuits.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2022
X-Ray Fault Injection: Reviewing Defensive Approaches from a Security Perspective.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022


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