Etienne Auvray

According to our database, Etienne Auvray authored at least 10 papers between 2013 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications.

Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Luc Saury

J. Electron. Test., April, 2023

2021

Improved Fault Diagnosis of Analog Circuits using Light Emission Measures.

Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Luc Saury

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

Relevant Signals and Devices for Failure Analysis of Analog and Mixed-signal Circuits.

Tommaso Melis, Emmanuel Simeu, Luc Saury, Etienne Auvray

Proceedings of the IEEE International Test Conference, 2021

2020

Automatic Fault Simulators for Diagnosis of Analog Systems.

Tommaso Melis, Emmanuel Simeu, Etienne Auvray

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

2019

Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip.

Safa Mhamdi, Arnaud Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, Eric Faehn, Aymen Ladhar

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2018

Scan-Chain Intra-Cell Aware Testing.

Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, Etienne Auvray

IEEE Trans. Emerg. Top. Comput., 2018

2017

Effective scan chain failure analysis method.

Etienne Auvray, Paul Armagnat, Luc Saury, Maheshwaran Jothi, Michael Brügel

Microelectron. Reliab., 2017

2014

Intra-Cell Defects Diagnosis.

Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Etienne Auvray

J. Electron. Test., 2014

On the Generation of Diagnostic Test Set for Intra-cell Defects.

Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Etienne Auvray

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Effect-cause intra-cell diagnosis at transistor level.

Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Etienne Auvray

Proceedings of the International Symposium on Quality Electronic Design, 2013