Pilin Junsangsri

Affiliations:
  • Northeastern University, Boston, MA, USA


According to our database1, Pilin Junsangsri authored at least 15 papers between 2010 and 2018.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2018
CCE: A Combined SRAM and Non Volatile Cache for Endurance of Next Generation Multilevel Non Volatile Memories in Embedded Systems.
Proceedings of the 14th IEEE/ACM International Symposium on Nanoscale Architectures, 2018

Multiple Fault Detection in Nano Programmable Logic Arrays.
Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018

2017
Design of a Low-Power Non-Volatile Programmable Inverter Cell for COGRE-based Circuits.
Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017

2016
Logic-in-Memory With a Nonvolatile Programmable Metallization Cell.
IEEE Trans. Very Large Scale Integr. Syst., 2016

Design of a hybrid non-volatile SRAM cell for concurrent SEU detection and correction.
Integr., 2016

2015
Circuits for a Perpendicular Magnetic Anisotropic (PMA) Racetrack Memory.
IEEE Trans. Multi Scale Comput. Syst., 2015

A Ternary Content Addressable Cell Using a Single Phase Change Memory (PCM).
Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20, 2015

2014
HSPICE macromodel of a Programmable Metallization Cell (PMC) and its application to memory design.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2014

A memristor-based TCAM (Ternary Content Addressable Memory) cell.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2014

A system-level scheme for resistance drift tolerance of a multilevel phase change memory.
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

A hybrid non-volatile SRAM cell with concurrent SEU detection and correction.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2012
Macromodeling a phase change memory (PCM) cell by HSPICE.
Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale Architectures, 2012

A memristor-based TCAM (ternary content addressable memory) cell: design and evaluation.
Proceedings of the Great Lakes Symposium on VLSI 2012, 2012

2011
A memristor-based memory cell using ambipolar operation.
Proceedings of the IEEE 29th International Conference on Computer Design, 2011

2010
Time/Temperature Degradation of Solar Cells under the Single Diode Model.
Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010


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