Rene Huebner

According to our database, Rene Huebner authored at least 1 paper in 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

Multi-scale Simulation Methodology for Stress Assessment in 3D IC: Effect of Die Stacking on Device Performance.

Valeriy Sukharev, Armen Kteyan, Jun-Ho Choy, Henrik Hovsepyan, Ara Markosian, Ehrenfried Zschech, Rene Huebner

J. Electron. Test., 2012