Roman Fragasse

According to our database, Roman Fragasse authored at least 6 papers between 2018 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

An Open-Circuit Voltage Pixel for Low-Light Visible Imaging in a Standard CMOS Process.

Roman Fragasse, Ramy Tantawy, Dale Shane Smith, Suat Ay, Waleed Khalil

Proceedings of the 17th Conference on Ph.D Research in Microelectronics and Electronics, 2022

2021

Signal and Noise Analysis of an Open-Circuit Voltage Pixel for Uncooled Infrared Image Sensors.

Roman Fragasse, Ramy Tantawy, Dale Shane Smith, Teressa Specht, Zahra Taghipour, Phillip Van Hooser, Christopher Taylor, Theodore J. Ronningen, Earl Fuller, Charles Reyner, Joshua M. Duran, Gamini Ariyawansa, Sanjay Krishna, Waleed Khalil

IEEE Trans. Circuits Syst. I Regul. Pap., 2021

2020

Advancing Uncooled Infrared Imagers Using An Open-Circuit Voltage Pixel.

Roman Fragasse, Ramy Tantawy, Dale Shane Smith, Teressa Specht, Zahra Taghipour, Phillip Van Hooser, Christopher Taylor, Theodore J. Ronningen, Earl Fuller, Rudy Fink, Sanjay Krishna, Waleed Khalil

Proceedings of the 11th IEEE Latin American Symposium on Circuits & Systems, 2020

2019

Wide-Bandwidth, High-Linearity, 2.8-GS/s, 10-bit Accurate Sample and Hold Amplifier in 130-nm SiGe BiCMOS.

Ramy Tantawy, Vipul J. Patel, Dale Shane Smith, S. M. Shahriar Rashid, Matthew J. Casto, Lucas Duncan, Roman Fragasse, Brian Dupaix, Luciano Boglione, Joel Goodman, Waleed Khalil

IEEE Trans. Circuits Syst. I Regul. Pap., 2019

Analysis of SRAM Enhancements Through Sense Amplifier Capacitive Offset Correction and Replica Self-Timing.

Roman Fragasse, Ramy Tantawy, Brian Dupaix, Trevor Dean, Daron Disabato, Matthew R. Belz, Dale Shane Smith, Jamin J. McCue, Waleed Khalil

IEEE Trans. Circuits Syst. I Regul. Pap., 2019

2018

Sense amplifier offset cancellation and replica timing calibration for high-speed SRAMs.

Roman Fragasse, Brian Dupaix, Ramy Tantawy, Todd James, Waleed Khalil

Proceedings of the 9th IEEE Latin American Symposium on Circuits & Systems, 2018